ISSN:
1572-9605
Keywords:
EBSD
;
microstructure
;
superconductor
;
surface resistance
;
TBCCO
Source:
Springer Online Journal Archives 1860-2000
Topics:
Electrical Engineering, Measurement and Control Technology
,
Physics
Notes:
Abstract Tl2Ba2Ca2Cu3Ox thin films have been fabricated on (001) LaAlO3 and (001) MgO substrates. Films grown on LaAlO3 have Tc=112K and RS(80K, 10GHz)=0.2mΩ, while films on MgO have Tc=117K and Rs(80K, 10GHz)=0.7mΩ. The grain size and alignment of the films has been investigated using X-ray diffraction, Scanning Electron Microscopy and Electron Backscattered Diffraction. We show evidence for a markedly higher in-plane angular spread for films on MgO and believe that for films grown on this substrate the lowest achievable values of Rs are limited by disorder in the in-plane alignment of the TBCCO film caused by the large lattice mismatch between the materials.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1023/A:1022685913672
Permalink
