ISSN:
1573-2746
Keywords:
grain boundaries
;
reference structures
;
transmission electron microscopy
Source:
Springer Online Journal Archives 1860-2000
Topics:
Chemistry and Pharmacology
,
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
,
Physics
Notes:
Abstract A transmission electron microscopy study and geometric analysis has been performed on a vicinal 69.3° high angle grain boundary in pure Ti which exhibits a characteristic dislocation arrangement. The dislocation configuration was modelled using the usual CSL/DSC/O-lattice approach and the predicted arrangement required to accommodate the deviation from a ∑37 three-dimensional CSL matched well with the arrangement observed experimentally. It was, however, also shown that an identical arrangement would be required to accommodate the deviation from a Γ37 two-dimensional CSL. Thus the analysis of such boundaries does not constitute a good test to distinguish between the two- and three-dimensional models of the low-energy reference structures adopted high-angle grain boundaries.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1023/A:1008770918151
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