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Three dimensional characterization of trace element distribution in high purity chromium (1996)

Hutter, H. ; Brunner, C. ; Wilhartitz, P. ; [et al.]

Springer

Microchimica acta 122 (1996), S. 195-202

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ISSN: 1436-5073

Keywords: corrosion ; material science ; grain boundaries ; imaging

Source: Springer Online Journal Archives 1860-2000

Topics: Chemistry and Pharmacology

Notes: Abstract The investigation of the distribution of trace elements in two chromium samples with different corrosion resistivity is reported. The concentration of the trace elements in both samples is in the typical range of high purity chromium and did not explain the different behaviour in the corrosion test. To measure the three-dimensional distribution imaging secondary ion mass spectrometry (SIMS) was used. Fine details were measured by scanning SIMS because of the better resolution. An enrichment of nitrogen and carbon at the grain boundaries of the sample with lower corrosion resistivity was observed.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1007/BF01245782

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