Electronic Resource
Amsterdam
:
Elsevier
Microelectronic Engineering
8 (1988), S. 293-310
ISSN:
0167-9317
Keywords:
Porous silicon
;
electrochemistry
;
interface properties
;
silicon-on-insulator technologies
Source:
Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
Topics:
Electrical Engineering, Measurement and Control Technology
Type of Medium:
Electronic Resource
URL:
http://linkinghub.elsevier.com/retrieve/pii/0167-9317(88)90022-6
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