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  • delay fault coverage  (1)
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    Electronic Resource
    Electronic Resource
    Tree-Structured Linear Cellular Automata and Their Applications in BIST (1999)
    Springer
    Journal of electronic testing 15 (1999), S. 297-300 
    Details
    ISSN: 1573-0727
    Keywords: linear finite state machines ; linear cellular automata ; pseudorandom test pattern generation ; delay fault coverage
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: Abstract A novel implementation structure of linear finite state machines, named tree-structured linear cellular automata (TLCA), is introduced. The structures and operations of TLCA are defined. The minimal cost maximum length machines and their implementation procedure are given. Our empirical study on the ISCAS'85 benchmark circuits shows the effectiveness of TLCA for testing stuck-open and delay faults.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1023/A:1008349210156
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