ISSN:
1572-896X
Keywords:
nanoparticle
;
size distribution
;
image analysis
;
deformable templates
;
ellipse model
Source:
Springer Online Journal Archives 1860-2000
Topics:
Physics
,
Technology
Notes:
Abstract Knowledge of the nanoparticle size distribution is important for the interpretation of experimental results in many studies of nanoparticle properties. An automated method is needed for accurate and robust estimation of particle size distribution from nanoparticle images with thousands of particles. In this paper, we present an automated image analysis technique based on a deformable ellipse model that can perform this task. Results of using this technique are shown for both nearly spherical particles and more irregularly shaped particles. The technique proves to be a very useful tool for nanoparticle research.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1023/A:1010023316775
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