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  • back-wave tube  (1)
  • optical constants  (1)
  • 1
    Electronic Resource
    Electronic Resource
    Springer
    International journal of infrared and millimeter waves 3 (1982), S. 19-43 
    ISSN: 1572-9559
    Keywords: grid ; diffraction parameter ; sliding point ; back-wave tube ; sublimmimetre BWT-spectroscopy ; resonance method
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract The method of submillimetre BWT-spectroscopy is used to measure electrodynamic parameters of the grids wound from conductors with circular cross sections. The coefficients of transmission and reflection, reflected wave phase, and ohmic losses in conductors are measured in the range of small values of diffraction parameteræ=D/λ〈1 (λ is the wavelength,D is the grid spacing) for the case where the wave vector E is directed along the conductors (E‖1). In the diffraction region (0.5〈æ〈2.2), transmission spectra of the grids are measured for both polarizations. The data obtained are compared to those of different theoretical methods for describing grid electrodynamics. In particular, the transmission spectra are shown to have some peculiarities in the vicinity of sliding pointsæ=1;2 (E⊥1), unpredicted by corresponding theories.
    Type of Medium: Electronic Resource
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  • 2
    ISSN: 1572-9559
    Keywords: Superconducting thin films ; far-infrared and submillimeter waves ; optical constants
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract Possibilities of determing the complex conductivity of thin super-conducting films using far-infrared and submillimeter reflectivity and transmissivity techniques are discussed. It is shown that within the framework of standard approaches a satisfactory accuracy is available only for the imaginary part of the conductivity (dielectric permittivity). Different resonator methods are suggested for measuring the real part of the conductivity. Data for superconducting NbN films at frequencies 3 – 25 cm−1 are presented.
    Type of Medium: Electronic Resource
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