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  • active mass expansion  (1)
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    Electronic Resource
    Electronic Resource
    Springer
    Journal of applied electrochemistry 28 (1998), S. 1313-1319 
    ISSN: 1572-8838
    Keywords: active mass expansion ; internal stress ; memory effect ; nickel oxide electrode
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology , Electrical Engineering, Measurement and Control Technology
    Notes: Abstract Full discharge of nickel–cadmium batteries after sustained overcharge or repeated shallow discharge shows a voltage step generally known as the ‘memory effect’. Nickel oxide electrode (NOE) gives a relevant contribution to the memory phenomenon, which has been related to the presence of the γ-phase. This phase, in fact, had been found by XRD analysis in a charged NOE showing such an effect. This work deals with the mechanical behaviour of NOEs cycled so as to produce the memory effect. During the cycling of asymmetric electrodes, a bending moment occurs during discharge: this is caused by the expansion of the active mass. The force, normal to the plane of the electrode, which equilibrates with the bending moment can be measured, thus giving an indication of the stresses suffered by the sintered supporting structure. Significant differences in both the electrochemical and mechanical behaviour after sustained overcharge and after shallow discharge have been observed. The different behaviours can be related to the unlike distribution of the γ-phase in the body of the electrode. It is suggested that the shallow cycling produces an accumulation of γ-phase at the contact with the current collector, whereas during sustained overcharge all the active mass is changed into γ-phase.
    Type of Medium: Electronic Resource
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