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  • VLSI  (1)
  • rhizosphere  (1)
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  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Plant and soil 227 (2000), S. 207-213 
    ISSN: 1573-5036
    Keywords: adsorption ; arbuscular mycorrhizal fungi ; biodegradation ; polycyclic aromatic hydrocarbons ; rhizosphere ; soil
    Source: Springer Online Journal Archives 1860-2000
    Topics: Agriculture, Forestry, Horticulture, Fishery, Domestic Science, Nutrition
    Notes: Abstract Polycyclic aromatic hydrocarbons (PAH) can be degraded in the rhizosphere but may also interact with vegetation by accumulation in plant tissues or adsorption on root surface. Previous studies have shown that arbuscular mycorrhizal (AM) fungi contribute to the establishment and maintenance of plants in a PAH contaminated soil. We investigated the fate of PAH in the rhizosphere and mycorrhizosphere including biodegradation, uptake and adsorption. Experiments were conducted with ryegrass inoculated or not with Glomus mosseae P2 (BEG 69) and cultivated in pots filled with soil spiked with 5 g kg−1 of anthracene or with 1 g kg−1 of a mixture of 8 PAH in a growth chamber. PAH were extracted from root surfaces, root and shoot tissue and rhizosphere soil and were analysed by GC-MS. In both experiments, 0.006 – 0.11‰ of the initial extractable PAH concentration were adsorbed to roots, 0.003 – 0.16‰ were found in root tissue, 0.001‰ in shoot tissue and 36 – 66% were dissipated, suggesting that the major part of PAH dissipation in rhizosphere soil was due to biodegradation or biotransformation. With mycorrhizal plants, anthracene and PAH were less adsorbed to roots and shoot tissue concentrations were lower than with non mycorrhizal plants, which could contribute to explain the beneficial effect of AM fungi on plant survival in PAH contaminated soils.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Springer
    Journal of electronic testing 16 (2000), S. 513-520 
    ISSN: 1573-0727
    Keywords: VLSI ; FPGA ; test ; ATPG
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: Abstract This paper addresses the problem of testing the configurable modules used in the local interconnect of SRAM-based FPGAs. First, it is demonstrated that a n address bit Configurable Interface Multiplexer requires N = 2 n test configurations considering a stuck-at as well as a functional fault model. Second, a logic cell with a set of k input Configurable Interface Modules with n address bits is analyzed and it is proven that the set of CIMs can be tested in parallel making the number of required test configurations equal to N = 2 n . Third, it is shown that the complete circuit i.e. a m × m array of sets of k Configurable Interface Multiplexers with n address bits can be tested with only N = 2 n test configurations using the XOR tree and shift register structures.
    Type of Medium: Electronic Resource
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