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  • Surface topography  (1)
  • atomic structure;  (1)
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  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Applied physics 8 (1975), S. 359-360 
    ISSN: 1432-0630
    Keywords: Secondary ion mass spectrometry ; Depth profiling ; Surface topography
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract SIMS depth profiles of copper-nickel thin film targets were measured with argon and nitrogen primary ions. While pronounced cone formation is observed in case of argon irradiation the erosion is much more uniform with nitrogen projectiles, probably due to formation of nitride surface layers.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Springer
    Speculations in science and technology 20 (1997), S. 115-132 
    ISSN: 1573-9309
    Keywords: atoms; ; atomic structure; ; quantization.
    Source: Springer Online Journal Archives 1860-2000
    Topics: Natural Sciences in General , Technology
    Notes: Abstract A new model of atoms based on the theory of material waves is proposed. Atoms are characterized by an inertial aggregation of negative charge within the atomic shell, the calculation yields, for hydrogen atoms, an atomic radius of 0.470 nm. Atomic spectra result from radial material waves, quantization being the consequence of boundary conditions imposed on the fundamental wave equation. Stark effects and Zeeman effects are treated in detail, they are referred to deformations and rotations of the atomic shell. An analysis of Stern--Gerlach experiments bases subsequent deflections of single atoms on rotations and interactions of magnetic fields.
    Type of Medium: Electronic Resource
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