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  • PACS. 06.20.Jr Determination of fundamental constants - 06.30.Bp Spatial dimensions (e.g., position, lengths, volume, angles, displacements, including nanometer-scale displacements) - 61.10.-i X-ray diffraction and scattering  (1)
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    Electronic Resource
    Electronic Resource
    Scanning X-ray interferometry and the silicon lattice parameter: towards relative uncertainty? (1999)
    Springer
    The European physical journal 9 (1999), S. 225-232 
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    ISSN: 1434-6036
    Keywords: PACS. 06.20.Jr Determination of fundamental constants - 06.30.Bp Spatial dimensions (e.g., position, lengths, volume, angles, displacements, including nanometer-scale displacements) - 61.10.-i X-ray diffraction and scattering
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract: In order to reduce measurement uncertainty of the (220) lattice spacing of silicon to a few parts per 109, a combined X-ray and optical interferometer capable of millimeter scans is being tested. A new series of measurements confirmed the value obtained with our previous set-up, and the bounds of measurement uncertainty were investigated. The article supplements the analysis of the error budget and provides a safer footing for the monocrystalline silicon lattice parameter value.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/s100510050760
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