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  • Mechanical Engineering  (1)
  • Poids  (1)
  • Stress distribution  (1)
  • 1
    Electronic Resource
    Electronic Resource
    Growth ofDiacrisia obliqua [Lep.: Arctiidae] with low doses ofBacillus thuringiensis var.Kurstaki (1989)
    Springer
    BioControl 34 (1989), S. 587-589 
    Details
    ISSN: 1573-8248
    Keywords: Weight ; Mortality ; Diacrisia obliqua ; Bacillus thuringiensis var.kurstaki ; Poids ; mortalité ; Diacrisia obliqua ; Bacillus thuringiensis var.kurstaki
    Source: Springer Online Journal Archives 1860-2000
    Topics: Agriculture, Forestry, Horticulture, Fishery, Domestic Science, Nutrition
    Description / Table of Contents: Résumé Les 3e stades larvaires deDiacrisia obliqua ont été traités avec des concentrations variées deBacillus thuringiensis var.Kurstaki (Dipel®) et la croissance des larves traitées a été estimée. Toutes les doses réduisent d'une façon significative le poids et la survie des insectes (P〈0.001).
    Notes: Abstract Early 3rd instarDiacrisia obliqua Walk. larvae were treated with concentrations ofBacillus thuringiensis var.kurstaki (Dipel®) and the growth of treated larvae was assessed. All the doses reduced significantly the weight and survival of the insects (p〈0.001).
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF02374397
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    A numerical method for the determination of slip characteristics between the layers of a two-layer slurry flow (1992)
    Chichester : Wiley-Blackwell
    International Journal for Numerical Methods in Fluids 14 (1992), S. 167-173 
    Details
    ISSN: 0271-2091
    Keywords: Finite element ; Interlayer slip ; Stress distribution ; Pressure drop ; Engineering ; Engineering General
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: The observed phenomenon of slip between the layers of a flowing slurry is modelled mathematically by a finite-element-based numerical technique. This technique enables us to quantify variables such as the slip velocity and shear stress distribution at the interlayer boundary and the pressure drop within the flow domain.
    Additional Material: 4 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/fld.1650140204
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    Paper (German National Licenses)
    Fulltext
  • 3
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    Unknown
    Carbon-Based Nano-Electro-Mechanical-Systems (2011)
    In:  Other Sources
    Details
    Publication Date: 2019-07-13
    Description: We provide an overview of our work where carbon-based nanostructures have been applied to two-dimensional (2D) planar and three-dimensional (3D) vertically-oriented nano-electro-mechanical (NEM) switches. In the first configuration, laterally oriented single-walled nanotubes (SWNTs) synthesized using thermal chemical vapor deposition (CVD) were implemented for forming bridge-type 2D NEMS switches, where switching voltages were on the order of a few volts. In the second configuration, vertically oriented carbon nanofibers (CNFs) synthesized using plasma-enhanced (PE) CVD have been explored for their potential application in 3D NEMS. We have performed nanomechanical measurements on such vertically oriented tubes using nanoindentation to determine the mechanical properties of the CNFs. Electrostatic switching was demonstrated in the CNFs synthesized on refractory metallic nitride substrates, where a nanoprobe was used as the actuating electrode inside a scanning-electron-microscope. The switching voltages were determined to be in the tens of volts range and van der Waals interactions at these length scales appeared significant, suggesting such structures are promising for nonvolatile memory applications. A finite element model was also developed to determine a theoretical pull-in voltage which was compared to experimental results.
    Keywords: Mechanical Engineering
    Type: SPIE DSS, Micro-and Nanotechnologies for Defense, Space and Security; Apr 25, 2011 - Apr 29, 2011; Orlando, FL; United States
    Format: text
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