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  • 1
    Publication Date: 2011-08-24
    Description: Tests were performed using commercially available silicon diode temperature sensors to detect the location of the liquid-vapor interface in hydrogen during ground test programs. Results show that by increasing the current into the sensor, silicon diodes can be used as liquid level point sensors. After cycling the sensors from liquid to vapor several times, it was found that with a 30 mA (milliamps) input current, the sensors respond within 2 seconds by measuring a large voltage difference when transitioning from liquid to vapor across the interface. Nearly instantaneous response resulted during a transition from vapor to liquid. Detailed here are test procedures, experimental results, and guidelines for applying this information to other test facilities.
    Keywords: INSTRUMENTATION AND PHOTOGRAPHY
    Type: In: International Instrumentation Symposium, 38th, Las Vegas, NV, Apr. 26-30, 1992, Proceedings (A93-37851 15-35); p. 287-299.
    Format: text
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  • 2
    Publication Date: 2019-08-28
    Description: The performance of a sensor is often evaluated by determining to what degree of accuracy a measurement can be made using this sensor. The absolute accuracy of a sensor is an important parameter considered when choosing the type of sensor to use in research experiments. Tests were performed to improve the accuracy of cryogenic temperature measurements by calibration of the temperature sensors when installed in their experimental operating environment. The calibration information was then used to correct for temperature sensor measurement errors by adjusting the data acquisition system software. This paper describes a method to improve the accuracy of cryogenic temperature measurements using corrections in the data acquisition system software such that the uncertainty of an individual temperature sensor is improved from plus or minus 0.90 deg R to plus or minus 0.20 deg R over a specified range.
    Keywords: INSTRUMENTATION AND PHOTOGRAPHY
    Type: In: International Instrumentation Symposium, 39th, Albuquerque, NM, May 2-6, 1993, Proceedings (A93-54351 24-35); p. 213-226.
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  • 3
    Publication Date: 2019-07-13
    Description: Tests were performed using commercially available silicon diode temperature sensors to detect the location of the liquid-vapor interface in hydrogen during ground test programs. Results show that by increasing the current into the sensor, silicon diodes can be used as liquid level point sensors. After cycling the sensors from liquid to vapor several times, it was found that with a 30 mA (milliamps) input current, the sensors respond within 2 seconds by measuring a large voltage difference when transitioning from liquid to vapor across the interface. Nearly instantaneous response resulted during a transition form vapor to liquid. Detailed here are test procedures, experimental results, and guidelines for applying this information to other test facilities.
    Keywords: INSTRUMENTATION AND PHOTOGRAPHY
    Type: NASA-TM-105541 , E-6851 , NAS 1.15:105541 , International Instrumentation Symposium; Apr 26, 1992 - Apr 30, 1992; Las Vegas, NV; United States
    Format: application/pdf
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  • 4
    Publication Date: 2019-07-13
    Description: The performance of a sensor is often evaluated by determining to what degree of accuracy a measurement can be made using this sensor. The absolute accuracy of a sensor is an important parameter considered when choosing the type of sensor to use in research experiments. Tests were performed to improve the accuracy of cryogenic temperature measurements by calibration of the temperature sensors when installed in their experimental operating environment. The calibration information was then used to correct for temperature sensor measurement errors by adjusting the data acquisition system software. This paper describes a method to improve the accuracy of cryogenic temperature measurements using corrections in the data acquisition system software such that the uncertainty of an individual temperature sensor is improved from plus or minus 0.90 deg R to plus or minus 0.20 deg R over a specified range.
    Keywords: INSTRUMENTATION AND PHOTOGRAPHY
    Type: NASA-TM-105996 , E-7536 , NAS 1.15:105996 , Aerospace Industries/Test Measurement Symposium; May 03, 1993 - May 06, 1993; Albuquerque, NM; United States
    Format: application/pdf
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