ALBERT

All Library Books, journals and Electronic Records Telegrafenberg

X
feed icon rss

Your email was sent successfully. Check your inbox.

An error occurred while sending the email. Please try again.

Proceed reservation?

Export
  • 1
    facet.materialart.
    Unknown
    Diffraction effects and special advantages in electronic heterodyne moire deflectometry (1986)
    In:  Other Sources
    Details
    Publication Date: 2011-08-19
    Description: Effects of diffraction on the performance of electronic heterodyne readout of moire fringes are investigated. The sensitivity, accuracy, and resolution of the system are calculated, and it is shown that these features are significantly improved compared with the conventional intensity moire readout technique. The sensitivity of the system can be tripled without changing the distance between gratings. The system was evaluated experimentally by measuring the refractive-index derivatives of a weak phase object consisting of a large KD(asterisk)P crystal. Effects of nonlinear fringe modulation were studied both theoretically and experimentally. It is shown that in this case the electronic phase is not linearly related to the fringe shift, and calibration of the system is necessary.
    Keywords: OPTICS
    Type: Applied Optics (ISSN 0003-6935); 25; 895-902
    Format: text
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    NASA TECHNICAL REPORTS
  • 2
    facet.materialart.
    Unknown
    Electronic heterodyne readout of fringes in moire deflectometry (1985)
    In:  Other Sources
    Details
    Publication Date: 2011-08-19
    Description: An electronic heterodyne technique is described for the readout of fringes in moire deflectometry. The technique is based on phase measurements of signals generated by a photodetector observing the light transmitted through a traveling moire fringe pattern. The phase of the signal is proportional to the fringe deviation and thus to the deflection angle of the light ray. The phase is measured on line by a standard phase meter with an accuracy of 1 deg or 1:360 of a fringe. The technique, which is precise and sensitive, is demonstrated by detecting and measuring a fringe shift of 0.15 mm corresponding to 0.029 of a fringe.
    Keywords: INSTRUMENTATION AND PHOTOGRAPHY
    Type: Optics Letters (ISSN 0146-9592); 10; 247-249
    Format: text
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    NASA TECHNICAL REPORTS
  • 3
    facet.materialart.
    Unknown
    Moire deflectometry with deferred electronic heterodyne readout (1985)
    In:  Other Sources
    Details
    Publication Date: 2011-08-19
    Description: The electronic heterodyne technique is applied to the task of deferred readout of phase objects' moire fringes. In combination with the heterodyne readout technique, moire deflectometry constitutes a powerful tool for the study of phase objects, exhibiting high sensitivity, ease of automation and recording, low cost, use of incoherent illumination, and independence from fringe contrast variations.
    Keywords: INSTRUMENTATION AND PHOTOGRAPHY
    Type: Applied Optics (ISSN 0003-6935); 24; 2298
    Format: text
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    NASA TECHNICAL REPORTS
  • 4
    facet.materialart.
    Unknown
    A comparison of electronic heterodyne moire deflectometry and electronic heterodyne holographic interferometry for flow measurements (1985)
    In:  Other Sources
    Details
    Publication Date: 2019-06-28
    Description: Electronic heterodyne moire deflectometry and electronic heterodyne holographic interferometry are compared as methods for the accurate measurement of refractive index and density change distributions of phase objects. Experimental results are presented to show that the two methods have comparable accuracy for measuring the first derivative of the interferometric fringe shift. The phase object for the measurements is a large crystal of KD P, whose refractive index distribution can be changed accurately and repeatably for the comparison. Although the refractive index change causes only about one interferometric fringe shift over the entire crystal, the derivative shows considerable detail for the comparison. As electronic phase measurement methods, both methods are very accurate and are intrinsically compatible with computer controlled readout and data processing. Heterodyne moire is relatively inexpensive and has high variable sensitivity. Heterodyne holographic interferometry is better developed, and can be used with poor quality optical access to the experiment.
    Keywords: INSTRUMENTATION AND PHOTOGRAPHY
    Type: SAE PAPER 851896
    Format: text
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    NASA TECHNICAL REPORTS
  • 5
    facet.materialart.
    Unknown
    A comparison of electronic heterodyne moire deflectometry and electronic heterodyne holographic interferometry for flow measurements (1985)
    In:  CASI
    Details
    Publication Date: 2019-06-28
    Description: Electronic heterodyne moire deflectometry and electronic heterodyne holographic interferometry are compared as methods for the accurate measurement of refractive index and density change distributions of phase objects. Experimental results are presented to show that the two methods have comparable accuracy for measuring the first derivative of the interferometric fringe shift. The phase object for the measurements is a large crystal of KD*P, whose refractive index distribution can be changed accurately and repeatably for the comparison. Although the refractive index change causes only about one interferometric fringe shift over the entire crystal, the derivative shows considerable detail for the comparison. As electronic phase measurement methods, both methods are very accurate and are intrinsically compatible with computer controlled readout and data processing. Heterodyne moire is relatively inexpensive and has high variable sensitivity. Heterodyne holographic interferometry is better developed, and can be used with poor quality optical access to the experiment.
    Keywords: INSTRUMENTATION AND PHOTOGRAPHY
    Type: NASA-TM-87071 , E-2643 , NAS 1.15:87071
    Format: application/pdf
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    NASA TECHNICAL REPORTS
  • 6
    facet.materialart.
    Unknown
    Deferred electronic heterodyne moire deflectometry: A method for transient density fields measurement (1989)
    In:  CASI
    Details
    Publication Date: 2019-06-28
    Description: Effects of spherical aberrations of the mirror used in the moire system on the angular resolution of the system are investigated. It is shown that the spherical aberrations may reduce significantly the performance of the conventional moire deflectometer. However, due to the heterodyne procedure, this is not the case with the heterodyne moire system. A moire system with a constant speed moving grating is demonstrated. It is shown that the system readout is linear and the system does not need calibration. In addition, the repeatability of the measurements is improved in this system as compared to the sinusoidally moving grating setup. The problem of the photographic plates alignment is solved by using a mechanical system in which the plate is held firmly throughout the experiment and accurately replaced after removing for photographic processing. The effect of a circular detector's aperture size on readout was tested. It is shown that the spatial phase variations, observed when scanning along a straight moire fringe, may considerably be reduced. At present we may say that both the on-line and the deferred heterodyne moire techniques may reliably be used. The errors of phase readings are 1 deg and 5 deg for the on-line and deferred methods. The total error due to subtraction of two readings at each position is, therefore, 1.4 deg and 7 deg, respectively. Further research for improving the deferred system is suggested.
    Keywords: OPTICS
    Type: NASA-CR-182982 , NAS 1.26:182982
    Format: application/pdf
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    NASA TECHNICAL REPORTS
  • 7
    facet.materialart.
    Unknown
    Two-color double exposure photographic recording technique (1989)
    In:  Other Sources
    Details
    Publication Date: 2019-07-12
    Description: A two-color double exposure technique is proposed for recording two close states of an object on the same photographic film. The idea is to use a two-color laser for illumination, one color for each state of the object, and a single photographic plate. After being developed, the image of each state may be observed separately. The technique is demonstrated for the deferred moire deflectometry where two closely displaced fringe patterns have to be recorded and resolved.
    Keywords: INSTRUMENTATION AND PHOTOGRAPHY
    Type: Applied Optics (ISSN 0003-6935); 28; 1822-182
    Format: text
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    NASA TECHNICAL REPORTS
  • 8
    facet.materialart.
    Unknown
    Error sources in deferred heterodyne moire deflectometry - An analytical study (1989)
    In:  Other Sources
    Details
    Publication Date: 2019-07-12
    Description: The effects of the aperture size and shape of the photodetector and of the structure of the grating lines on the performance of deferred electronic heterodyne moire deflectometry are studied. It is shown that scanning of a moire fringe pattern parallel to an unshifted fringe yields periodical variations in the heterodyne phase and amplitude, which cause severe errors in the measurements.
    Keywords: INSTRUMENTATION AND PHOTOGRAPHY
    Type: Applied Optics (ISSN 0003-6935); 28; 3972-397
    Format: text
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    NASA TECHNICAL REPORTS
  • 9
    facet.materialart.
    Unknown
    Performance of moire deflectometry with deferred electronic heterodyne readout (1987)
    In:  Other Sources
    Details
    Publication Date: 2019-07-12
    Description: The effects of diffraction and nonlinear photographic emulsion characteristics on the performance of deferred electronic heterodyne moire deflectometry are theoretically and experimentally investigated. The intensity transmission distribution of the transparency, the moire image, the heterodyne readout, and the spatial and angular resolution are analytically discussed. The deferred electronic heterodyne technique is evaluated by measuring small fringe shifts caused by a weak phase object. It is found that this technique can be applied for accurate and sensitive readout of moire fringes of unsteady phase objects. The theoretical study shows that the accuracy and sensitivity of the system are weakly affected by diffraction and nonlinear photographic emulsion characteristics. Nonlinear recording does not affect the spatial resolution of the system.
    Keywords: OPTICS
    Type: Optical Society of America, Journal, A: Optics and Image Science (ISSN 0740-3232); 4; 1798-180
    Format: text
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    NASA TECHNICAL REPORTS
  • 10
    facet.materialart.
    Unknown
    Sources of error in heterodyne moire deflectometry (1988)
    In:  Other Sources
    Details
    Publication Date: 2019-07-12
    Description: Alignment problems, and the accompanying errors, in heterodyne moire deflectometry are considered. A change in the x-directed offset between two states of a phase object causes a constant phase error, and it is noted that the relative x coordinate of the two photographic plates (the two states of the phase object) must be positioned typically within 1 micron to avoid a detectable offset. Possible solutions for assuring the relative alignment of the two deflectograms are considered, including a sandwich technique and a two-color double-exposure implementation.
    Keywords: INSTRUMENTATION AND PHOTOGRAPHY
    Type: Applied Optics (ISSN 0003-6935); 27; 1381-138
    Format: text
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    NASA TECHNICAL REPORTS
Close ⊗
This website uses cookies and the analysis tool Matomo. More information can be found here...