ALBERT

All Library Books, journals and Electronic Records Telegrafenberg

X
feed icon rss

Your email was sent successfully. Check your inbox.

An error occurred while sending the email. Please try again.

Proceed reservation?

Export
Filter
  • Polymer and Materials Science  (3)
  • Gene regulation  (1)
  • 1
    Electronic Resource
    Electronic Resource
    A new transcriptional activator for amylase genes in Aspergillus (1999)
    Springer
    Molecular genetics and genomics 262 (1999), S. 668-676 
    Details
    ISSN: 1617-4623
    Keywords: Key wordsamyR ; Amylases ; Gene regulation ; Aspergillus oryzae
    Source: Springer Online Journal Archives 1860-2000
    Topics: Biology
    Notes: Abstract We have cloned a regulatory gene for amylase synthesis in Aspergillus oryzae. This gene, amyR, encodes a 604-amino acid transcriptional activator with a Cys6 zinc cluster, that shows extensive homology to the DNA binding domain of GAL4 from Saccharomyces cerevisiae. The DNA binding domain of amyR binds to two types of sequences found in a number of promoters from Aspergillus genes coding for starch-degrading enzymes. One type of binding site is characterized by two CGG triplets separated by eight nucleotides. The other type has only one CGG triplet, which is followed by the sequence AAATTTAA.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/s004380051129
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 2
    Electronic Resource
    Electronic Resource
    Effects of morphology on the electrical and optical properties of thin bismuth films (1992)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 18 (1992), S. 153-158 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Thin films of bismuth were evaporated onto polished Si(100) substrates at substrate growth temperatures which varied between 25 and 100° C. The variations in film morphology observed using the scanning electron microscope and atomic force microscope were compared to changes in the optical and electrical properties of the thin Bi films. The optical properties could be modeled using an effective medium approximation, which suggested that the roughness of the films changed with substrate growth temperature. The film roughness appeared to decrease with substrate temperature from room temperature deposition to a minimum roughness at temperatures of ∼70 °C. Higher temperatures again resulted in an increased roughness, which correlated with a change in morphology observed by SEM. The electrical resistance of the samples was not sensitive to roughness changes in the film, but did change abruptly for the higher temperature samples where the morphology was substantially different. The transverse magnetoresistance was sensitive to film structure, increasing with substrate growth temperature up to a maximum substrate temperature of 70 °C before decreasing again at higher temperatures.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740180216
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 3
    Electronic Resource
    Electronic Resource
    Clean Surface and Oxidation Behavior of Vanadium Carbide, VC0.75(100) (1996)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 24 (1996), S. 681-686 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The clean single-crystal VC0.75(100) surface, its oxidation, and the stability of the resulting oxide were examined with electron spectroscopy (AES, XPS and UPS), electron diffraction (low-energy and reflection high-energy electron diffraction) and atomic force microscopy (AFM). The clean VC0.75 surface exhibits carbon vacancy-related features in valence band spectroscopy data. This surface was exposed to O2 at 500 °C for up to 10 000 Langmuirs. The oxidation leads to the formation of vanadium oxide, VOx(100), crystallites on the VC0.75(100) substrate. The AFM images indicate that oxide crystallites grow with an elongated shape along 〈001〉 type directions. When heated above 1000 °C, the oxide is unstable and a clean VC0.75(100) surface is produced.
    Additional Material: 10 Ill.
    Type of Medium: Electronic Resource
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
  • 4
    Electronic Resource
    Electronic Resource
    Thermal stability of benzotriazole on copper during atmospheric corrosion (1991)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 17 (1991), S. 3-6 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Atmospheric corrosion of copper can result in substantial problems for electrical interconnection in microelectronic applications. We have used x-ray photoelectron spectroscopy (XPS) to examine the effects of benzotriazole (BTA), an organic corrosion inhibitor, on atmospheric oxidation and sulfidation of polycrystalline copper in the temperature range 30-200 °C. XPS results demonstrated that BTA was lost depended on the ambient composition. BTA was least stable in sulfur-containing environments, disappearing from the surface at temperatures above 150 °C. BTA was quite stable in pure nitrogen and in a vacuum up to temperatures near 200 °C. This suggests that the loss mechanism involved a chemical reaction rather than solely a thermal process. The BTA-Cu(II) complex existing at room temperature was irreversibly converted into a BTA-Cr(I) complex upon heating above 90 °C in a vacuum.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740170104
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
Close ⊗
This website uses cookies and the analysis tool Matomo. More information can be found here...