ALBERT

All Library Books, journals and Electronic Records Telegrafenberg

feed icon rss

Your email was sent successfully. Check your inbox.

An error occurred while sending the email. Please try again.

Proceed reservation?

Export
  • 1
    Electronic Resource
    Electronic Resource
    Springer
    The international journal of advanced manufacturing technology 11 (1996), S. 258-266 
    ISSN: 1433-3015
    Keywords: Cellular automaton ; Flexible manufacturing systems ; Modelling
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract In this paper, we propose a high-level state-based dependency description and structuring formalism for flexible manufacturing systems (FMS). This extended cellular automaton model (ECAM) is designed to capture the behaviour and performance of a large complex concurrent system in an easier and more concise way than is possible with other contemporary FMS models. Concurrency problems of FMS can be clearly identified by the model. The model is defined mathematically as a quintuple by adapting the cellular automaton. A set of graphical symbols is also defined to represent the states of the model. The proposed model can serve as a formal specification and documentation tool for an FMS. It can also provide a basis for modelling important characteristics of FMS which includes conflict resolution, dependencies and starvation of resources. In real applications, it can serve as a conceptual model in the FMS design process. Based on this model a prototype system has been developed to generate a set of executable grammar rules. With appropriate extensions, the system can be used as simulation and performance analysis tools.
    Type of Medium: Electronic Resource
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
Close ⊗
This website uses cookies and the analysis tool Matomo. More information can be found here...