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  • Electronics and Electrical Engineering  (1)
  • 1
    Publication Date: 2019-07-13
    Description: The degradation of the LM193 dual voltage comparator has been studied at different TID dose rate profiles, including several different constant dose rates and a variable dose rate that simulates the behavior of a solar flare. A comparison of results following constant dose rate vs. variable dose rates is made to explore how well the constant dose rates used for typical part testing predict the performance during a simulated space-like mission. Testing at a constant dose rate equal to the lowest dose rate seen during the simulated flare provides an extremely conservative estimate of the overall amount of degradation. A constant dose rate equal to the average dose rate is also more conservative than the variable rate. It appears that, for this part, weighting the dose rates by the amount of total dose received at each rate (rather than the amount of time at each dose rate) results in an average rate that produces an amount of degradation that is a reasonable approximation to that received by the variable rate.
    Keywords: Electronics and Electrical Engineering
    Type: TNS-00449-2008.RI , 2008 IEEE Nuclear and Space Radiation Effects Conference; Jul 14, 2008 - Jul 18, 2008; Tucson, AZ; United States
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