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  • 1
    ISSN: 1573-0476
    Keywords: safety ; contingent valuation ; embedding ; scope ; sequencing
    Source: Springer Online Journal Archives 1860-2000
    Topics: Economics
    Notes: Abstract This article reports the results of two studies aimed at testing and refining a procedure for estimating willingness-to-pay based monetary values of safety using the contingent valuation method. In spite of the fact that respondents were given the opportunity to discuss various safety issues and key concepts in focus group meetings held in advance of individual interviews, and were also given ample opportunity to revise their responses in the light of the overall pattern of these responses, the results show clear evidence of extensive and persistent insensitivity to the scale and scope of the safety improvements that were specified in the contingent valuation questions, as well as vulnerability to framing effects. This clearly casts serious doubt on the reliability and validity of willingness-to-pay based monetary values of safety estimated using conventional contingent valuation procedures.
    Type of Medium: Electronic Resource
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  • 2
    ISSN: 1573-0476
    Keywords: Safety ; contingent valuation ; standard gambles ; embedding ; scope ; sequencing
    Source: Springer Online Journal Archives 1860-2000
    Topics: Economics
    Notes: Abstract This article reports the results of a study aimed at estimating a willingness-to-pay based value of statistical life for road risks using a multi-stage approach which involves "chaining together" responses to contingent valuation and standard gamble questions. The rationale for employing a multi-stage approach is to break the wealth/risk of death trade-off down into a number of conceptually manageable steps, thereby trying to attenuate the various biases that appear to be pervasive in responses to more direct contingent valuation questions in the health and safety field.
    Type of Medium: Electronic Resource
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  • 3
    Publication Date: 2019-07-13
    Description: The Plasmoid Thruster Experiment (PTX) operates by inductively producing plasmoids in a conical theta-pinch coil and ejecting them at high velocity. A plasmoid is a plasma with an imbedded closed magnetic field structure. The shape and magnetic field structure of the translating plasmoids have been measured with of an array of magnetic field probes. Six sets of two B-dot probes were constructed for measuring B(sub z) and B(sub theta), the axial and azimuthal components of the magnetic field. The probes are wound on a square G10 form, and have an average (calibrated) NA of 9.37 x l0(exp -5) square meters, where N is the number of turns and A is the cross-sectional area. The probes were calibrated with a Helmholtz coil, driven by a high-voltage pulser to measure NA, and by a signal generator to determine the probe's frequency response. The plasmoid electron number density n(sub e) electron temperature T(sub e), and velocity ratio v/c(sub m), (where v is the bulk plasma flow velocity and c(sub m), is the ion thermal speed) have also been measured with a quadruple Langmuir probe. The Langmuir probe tips are 10 mm long, 20-mil diameter stainless steel wire, housed in a 6-inch long 4-bore aluminum rod. Measurements on PTX with argon and hydrogen from the magnetic field probes and quadruple Langmuir probe will be presented in this paper.
    Keywords: Electronics and Electrical Engineering
    Type: Joint Propulsion Conference; Jul 11, 2004 - Jul 14, 2004; Fort Lauderdale, FL; United States
    Format: application/pdf
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  • 4
    Publication Date: 2019-08-28
    Description: A coil system for a plasmoid thruster includes a bias coil, a drive coil and field coils. The bias and drive coils are interleaved with one another as they are helically wound about a conical region. A first field coil defines a first passage at one end of the conical region, and is connected in series with the bias coil. A second field coil defines a second passage at an opposing end of the conical region, and is connected in series with the bias coil.
    Keywords: Electronics and Electrical Engineering
    Format: application/pdf
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