Publication Date:
2014-04-24
Description:
Author(s): J. J. Peng, C. Song, B. Cui, F. Li, H. J. Mao, Y. Y. Wang, G. Y. Wang, and F. Pan We verify that the exchange bias effect unexpectedly emerges in a single LaMnO3−δ film, one of the most studied correlated oxides. We combine x-ray absorption spectroscopy results, which serves as a fingerprint of the electronic structure, with microstructure characterizations and magnetization data... [Phys. Rev. B 89, 165129] Published Wed Apr 23, 2014
Keywords:
Electronic structure and strongly correlated systems
Print ISSN:
1098-0121
Electronic ISSN:
1095-3795
Topics:
Physics
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