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  • 1
    Electronic Resource
    Electronic Resource
    Springer
    International journal of fracture 99 (1999), S. 307-323 
    ISSN: 1573-2673
    Keywords: Crack ; stress intensity factor ; crack closure ; spherical shells.
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract This article presents an analytical and numerical study of the influence of crack face closure on the stress intensity factor of a crack in a spherical shell subjected to membrane force and bending moment. The formulation developed by Delale and Erdogan based on linearised shallow shell theories is extended to account for crack surface closure in cracked spherical shells, assuming a line contact at the compressive edge of the crack face. It is found that, due to the curvature effects, the closure behaviour of cracks in spherical shell differs significantly from that in flat plates. Depending on the nature of the membrane force and bending moment, crack closure may occur over the entire crack length or only some segments. In the special case of full length crack closure, the coupled integral equations reduce to a single integral equation, leading to a simpler solution. The theoretical results are compared against finite element results of cracked shells compressed between two rigid plates, indicating that the shallow shell theory is valid for a shallowness parameter up to 1/5.
    Type of Medium: Electronic Resource
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  • 2
    Publication Date: 2015-08-26
    Description: Author(s): Huaqing Huang, Zhaoyou Wang, Nannan Luo, Zhirong Liu, Rong Lü, Jian Wu, and Wenhui Duan We theoretically investigate the electronic properties of the interface between quantum spin Hall (QSH) and quantum anomalous Hall (QAH) insulators. A robust chiral gapless state, which substantially differs from edge states of QSH or QAH insulators, is predicted at the QSH/QAH interface using an ef… [Phys. Rev. B 92, 075138] Published Tue Aug 25, 2015
    Keywords: Electronic structure and strongly correlated systems
    Print ISSN: 1098-0121
    Electronic ISSN: 1095-3795
    Topics: Physics
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