Publication Date:
2013-08-31
Description:
The Space Plasma-High Voltage Drainage Experiment (SP-HVDE) was comprised of two identical experimental trays. With one tray located on the leading (ram facing, B10) edge and the other located on the trailing (wake facing, D4) edge of the Long Duration Exposure Facility (LDEF), it was possible to directly compare the effects of ram and wake spacecraft environments on charged dielectric materials. Six arrays of Kapton dielectric samples of 2 mil, 3 mil, and 5 mil thicknesses maintained at +/- 300, +/- 500, and +/- 1000 voltage bias formed the experimental matrix of each tray. In addition, each tray carried two solar cell strings, one biased at +300 volts and the other at -300 volts, to study current leakage from High Voltage Solar Arrays (HVSA). The SP-HVDE provides the first direct, long-term, in-flight measurements of average leakage current through dielectric materials under electric stress. The experiment also yields information on the long term stability of the bulk dielectric properties of such materials. Data and findings of the SP-HVDE are an extension of those from shorter term flight experiments such as the PIX-1 (Plasma Interaction Experiment) and PIX-2 and are therefore valuable in the design and evaluation of long-lived space systems with high voltage systems exposed to the low earth orbital environment. A summary of the SP-HVDE post flight analysis final report delivered to the LDEF Project Office under contract to the National Aeronautics and Space Administration is presented.
Keywords:
ELECTRONICS AND ELECTRICAL ENGINEERING
Type:
NASA. Langley Research Center, LDEF: 69 Months in Space. Part 4: Second Post-Retrieval Symposium; p 1343-1354
Format:
application/pdf
Permalink
