Publication Date:
2019-08-28
Description:
Internal reflection spectroscopy may be used to determine presence of water in thin film pores. Presence of water in such pores is function of relative humidity and pore size. Thus, one can determine pore size by controlling humidity. Fluids with surface tension different from that of water can be used to detect pores.
Keywords:
ELECTRONIC COMPONENTS AND CIRCUITS
Type:
HQN-10673
Format:
application/pdf
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