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  • ELECTRONIC COMPONENTS AND CIRCUITS  (1)
  • STRUCTURAL MECHANICS  (1)
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  • 1
    Publication Date: 2019-08-28
    Description: Internal reflection spectroscopy may be used to determine presence of water in thin film pores. Presence of water in such pores is function of relative humidity and pore size. Thus, one can determine pore size by controlling humidity. Fluids with surface tension different from that of water can be used to detect pores.
    Keywords: ELECTRONIC COMPONENTS AND CIRCUITS
    Type: HQN-10673
    Format: application/pdf
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  • 2
    Publication Date: 2019-07-13
    Description: Two principle areas studied were stress corrosion crack growth rates of a titanium alloy in liquid environments containing halide ions and pitting corrosion of titanium in bromide solutions. Two initial assumptions were made, that the rate of propagation was controlled by a macroscopic solution parameter and that this parameter was viscosity. A series of solutions were prepared using lithium chloride as the solute and water, methanol, glycerin, formic acid, acetone, dimethyl sulphoxide, etc. As solvents, these solutions were prepared with a 5:1 solvent-solute ratio. Viscosity was varied by changing the temperature and it was found: (1) In all solvents the velocity of cracking was proportional to the reciprocal of the viscosity. (2) Each solvent gave a separate relationship, (3) The temperature dependence and numerical values for the apparent activation energy of cracking and viscosity were the same.
    Keywords: STRUCTURAL MECHANICS
    Type: NASA-CR-127726 , D180-15006-1
    Format: application/pdf
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