ISSN:
1573-4889
Keywords:
ELECTROCHEMICAL-IMPEDANCE SPECTROSCOPY
;
ELECTRICAL PROPERTIES
;
OXIDE FILMS
;
DEFECTS
;
STAINLESS STEELS
Source:
Springer Online Journal Archives 1860-2000
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
Abstract Oxide films formed on three stainless steels(UNS S30403; S44600; S30815) in air at 800°C werecharacterized by electrochemical-impedance spectroscopy(EIS). The film evolution vs. oxidation time wasinvestigated from 1 to 1000 hr. A three-electrodeelectrochemical cell and 0.1 MNa2SO4 solution were employed forEIS measurements. The spectra were interpreted in termsof a two-layer model of the films, where the capacitance and resistance obtained can berelated to the thickness (or roughness) anddefectiveness of the films. The results reveal that theoxide on S30403 grows and becomes defective, the oxideon S44600 thickens rapidly and retains its protectiveability for a relatively long time, and the oxide onS30815 remains thin and resistive. The two-layer modelis supported by surface characterization with SEM/EDS and in-depth profile of the oxide filmsobtained through glow discharge optical emissionspectroscopy (GDOES).
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1023/A:1018856808917
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