ISSN:
0741-0581
Schlagwort(e):
Reflection electron microscopy (REM)
;
Cross-sections
;
Interfaces
;
Life and Medical Sciences
;
Cell & Developmental Biology
Quelle:
Wiley InterScience Backfile Collection 1832-2000
Thema:
Allgemeine Naturwissenschaft
Notizen:
Reflection electron microscopy (REM) is shown to be applicable to the testing of the quality of AlxGa1-xAs/GaAs layer structures. Cross-sectional images of quantum well structures with layer thickness down to 1 nm can be obtained. The practical aspects of the REM technique are presented. The most important advantages and drawbacks of cross-sectional REM are discussed in detail.
Zusätzliches Material:
10 Ill.
Materialart:
Digitale Medien
URL:
http://dx.doi.org/10.1002/jemt.1060020603
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