Publication Date:
2011-01-19
Description:
Author(s): T. T. Fister, D. D. Fong, J. A. Eastman, H. Iddir, P. Zapol, P. H. Fuoss, M. Balasubramanian, R. A. Gordon, K. R. Balasubramaniam, and P. A. Salvador To study equilibrium changes in composition, valence, and electronic structure near the surface and into the bulk, we demonstrate the use of a new approach, total-reflection inelastic x-ray scattering, as a sub-keV spectroscopy capable of depth profiling chemical changes in thin films with nanometer... [Phys. Rev. Lett. 106, 037401] Published Tue Jan 18, 2011
Keywords:
Condensed Matter: Electronic Properties, etc.
Print ISSN:
0031-9007
Electronic ISSN:
1079-7114
Topics:
Physics
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