Publication Date:
2013-01-04
Description:
Author(s): J. Park, B.-G. Cho, K. D. Kim, J. Koo, H. Jang, K.-T. Ko, J.-H. Park, K.-B. Lee, J.-Y. Kim, D. R. Lee, C. A. Burns, S. S. A. Seo, and H. N. Lee Resonant soft-x-ray scattering measurements have been performed to investigate interface electronic structures of (LaAlO 3 /SrTiO 3 ) superlattices. Resonant scattering intensities at superlattice reflections show clear evidence of degeneracy lifting in t 2 g states of interface Ti ions. Polarization depe... [Phys. Rev. Lett. 110, 017401] Published Thu Jan 03, 2013
Keywords:
Condensed Matter: Electronic Properties, etc.
Print ISSN:
0031-9007
Electronic ISSN:
1079-7114
Topics:
Physics
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