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  • 1
    Electronic Resource
    Electronic Resource
    Electron microscopic study of partial dislocations in textured Y-Ba-Cu-O superconductors (1992)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 72 (1992), S. 4634-4637 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Electron microscopy shows that textured Y-Ba-Cu-O superconductors contain many partial dislocations associated with stacking faults in a-b planes. Two types of partial dislocations parallel to the [100] and [010] direction have been identified with Burgers vectors [a/2, 0, c/6] and [0, −b/2, c/6], respectively, which are the same as the displacement vectors of the associated stacking faults.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.352117
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  • 2
    Electronic Resource
    Electronic Resource
    Reduction of secondary defects in MeV ion-implanted silicon by means of ion beam defect engineering (1992)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 71 (1992), S. 3780-3784 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A new concept of ion beam defect engineering is proposed. Reduction of secondary defects in 1 MeV As ion-implanted Si(100) has been investigated by Rutherford backscattering/channeling and high resolution electron microscopy. It is found that the additional irradiation of 1.6 MeV Si ions prior to two-step thermal annealing leads to a noticeable reduction of secondary defects. Good recrystallization of a buried amorphous layer is also obtained by irradiation of 1.6 MeV, 2×1015 Si/cm2 into the implanted Si sample held at elevated temperatures.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.350889
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  • 3
    Electronic Resource
    Electronic Resource
    Large low-field magnetoresistance in strained ultrathin Pr0.67Sr0.33MnO3 films (2000)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 87 (2000), S. 6749-6751 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Strain effect on the low-field magnetoresistance (LFMR) in epitaxially grown Pr0.67Sr0.33MnO3 thin films has been studied. Very large LFMR and MR hysteresis have been found in compressive-strain ultrathin films grown on LaAlO3 (001) substrates when a magnetic field is applied perpendicular to the film plane. The LFMR ratio as high as 360% at H=1600 Oe and T=30 K was obtained from the MR hysteresis curve. The large LFMR depends strongly on the applied magnetic field direction as well as the film thickness. It is reduced to less than 10% when the film thickness is about 20 nm. In comparison, tensile-strain films on SrTiO3(001) show positive LFMR, and almost strain free films on NdGaO3 (110) show very small LFMR (〈2%), at comparable magnetic fields and temperatures. These effects were found to be closely related to the strain-induced magnetic anisotropy. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.372829
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  • 4
    Electronic Resource
    Electronic Resource
    Domain wall resistance in ultrathin manganite films (2001)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 89 (2001), S. 6952-6954 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Resistance related to magnetic domain walls in compressive-strained epitaxial manganite ultrathin films has been studied. The samples were demagnetized in different ways to induce either multidomain or single domain states. Very large difference in resistance was observed between the two states, which was attributed to the domain wall resistance. The magnitude of the domain wall resistance was found to be different in different manganite compounds. We have shown that large domain wall resistance can be obtained in strained ultrathin manganite films and the result cannot be simply explained by the existing models. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1362645
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  • 5
    Electronic Resource
    Electronic Resource
    Transmission electron microscopy observations of ferroelectric domains in the tetragonal Pb(Ni1/3Nb2/3)O3–PbZrO3–PbTiO3 ceramics modified by bismuth and zinc (2001)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 89 (2001), S. 5079-5082 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Ferroelectric domains of the tetragonal (Pb0.985Bi0.01)(Ni1/4Zn1/12Nb2/3)0.2(ZrσTi1−σ)0.8O3 (σ=0.30 and 0.40) ceramics were investigated by transmission electron microscopy and electron diffraction. It was observed that the 90° macrodomains displayed the shape of simple lamella twinning, and that the δ-fringe contrast was frequently observed within these configurations of 90° domains. The 180° domain walls with zigzag structure between 90° domain walls were also observed. The formation sequences of the 90° and 180° domain structures were discussed in terms of energy minimization during the phase transition from cubic to tetragonal ferroelectric phase on cooling. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1362404
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  • 6
    Electronic Resource
    Electronic Resource
    Role of strain in magnetotransport properties of Pr0.67Sr0.33MnO3 thin films (2000)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 87 (2000), S. 7409-7414 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have studied the strain effects on the structural and magnetotransport properties of Pr0.67Sr0.33MnO3 (PSMO) thin films. The PSMO films were epitaxially grown on LaAlO3 (001), SrTiO3 (001), and NdGaO3 (110) substrates that induce biaxial compressive, tensile, and almost no strain in the films, respectively. The film thickness t, varied between 4–400 nm, was used as another controlling parameter of strain for each type of film. There exist two distinct thickness ranges with different thickness dependence of the magnetotransport properties. For t〈20 nm, the zero-field resistance peak temperature (Tp) and the high-field magnetoresistance (HFMR) properties are critically dependent on the thickness and the substrate. For t〉20 nm, the Tp and the HFMR ratio show weak t dependence. The results show evidence for the effects of the Jahn–Teller type distortion as well as disorders on the resistive transition temperature and the HFMR. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.373002
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  • 7
    Electronic Resource
    Electronic Resource
    Superparamagnetic behavior and giant magnetoresistance in oxygen deficient R0.67Sr0.33MnOz (R=Nd, Pr) epitaxial films (abstract) : The 40th annual conference on magnetism and magnetic materials (1996)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 79 (1996), S. 4552-4552 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have studied the magnetic and magnetotransport properties of oxygen deficient R0.67Sr0.33MnOz (R=Nd, Pr) films and have observed superparamagnetic behavior in these films. The superparamagnetism is indicated by (i) the increasing spread between zero field cooled (ZFC) and field cooled (FC) magnetization curves as temperature decreases, (ii) a sharp drop of the ZFC magnetization at low temperature, (iii) enhanced Curie–Weiss constant above the ferromagnetic temperature, and (iv) at low temperature a sharp drop of coercivity (Hc) with increasing temperature. These findings strongly suggest that all oxygen deficient manganites are magnetically inhomogeneous; i.e., ferromagnetic clusters exist. We estimate the spin cluster diameter to be 7–10 nm at low temperature (T〈30 K). We discuss a possible origin of the giant magnetoresistance effect based on the existence of spin clusters. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.361545
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  • 8
    Electronic Resource
    Electronic Resource
    dc electric field effect on the microwave properties of YBa2Cu3O7/SrTiO3 layered structures (1994)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 76 (1994), S. 2937-2950 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We present a summary of our work on the dc electric field effect on the microwave properties of YBa2Cu3O7/SrTiO3 (YBCO/STO) layered structures. We briefly describe the fabrication of these layered structures, their structural and electrical properties related to the microwave response, and experimental methods to investigate dc electric field effects at microwave frequencies. Analysis of microwave measurements shows that dc electric field modulated changes in both the complex conductivity of YBCO layers and the dielectric properties of the STO layers contribute to the overall device response. At low temperatures (〈50 K) and large electric fields, good samples show linear gate-voltage modulation of microwave surface resistance and surface reactance attributable to field induced superconducting hole filling and depletion in the dominant YBCO layer.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.357533
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  • 9
    Electronic Resource
    Electronic Resource
    Mechanisms of optical response in superconducting YBa2Cu3O7−δ thin films and grain-boundary weak links (1994)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 76 (1994), S. 5829-5838 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The optical response of single grain-boundary weak links in superconducting YBCO thin films has been investigated. At temperatures well below the transition temperature, the grain boundary exhibits an optical response which is qualitatively different from transition edge response. Using a resistively shunted-junction model for the grain-boundary weak link, we find that the optical response below the transition temperature can be described by radiation induced thermal modulation of the critical currents of the weak links. The dependence on the bias current and the temperature distinguishes the weak-link optical response from the transition edge optical response. We discuss novel aspects of a potential radiation detector based on grain-boundary weak-link junctions.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.358396
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  • 10
    Electronic Resource
    Electronic Resource
    Superconducting and structural properties of Nd2−xCexCuO4−y thin films on perovskite and fluorite substrates (1994)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 75 (1994), S. 2119-2124 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: High quality epitaxial Nd2−xCexCuO4−y (NCCO) thin films were fabricated on various substrates by pulsed-laser deposition using N2O reactive gas. The similarities and dissimilarities of the superconducting and structural properties of NCCO films, on perovskite-type substrates such as LaAlO3, NdGaO3, and SrTiO3 and on a fluorite-type substrate of yttria-stabilized zirconia (YSZ), were investigated systematically as a function of film thickness by transport measurements and structural analysis. A remarkable reduction of Tc was observed when the film was thinner than a critical thickness, which strongly depends on the substrate. The critical thicknesses for which Tc is 80% of Tc max are 1200, 1000, 600, and 450 A(ring) for LaAlO3, NdGaO3, SrTiO3, and YSZ, respectively. YSZ turns out to be the best candidate for the growth of very thin NCCO films among the substrates studied. These results show a strong correlation between the strain and Tc in NCCO thin films and point the way to the fabrication of n-type superconducting electric field devices using ultrathin NCCO films.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.356318
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