Publication Date:
2019-08-13
Description:
ToF-SIMS images of Genesis sample surfaces contain an incredible amount of important information, but they also show that the crash-derived surface contamination has many components, presenting a challenge to cleaning. Within the variability, we have shown that there are some samples which appear to be clean to begin with, e.g. 60471, and some are more contaminated. Samples 60493 and 60500 are a part of a focused study of the effectiveness of aqua regia and/or sulfuric acid cleaning of small flight Si implanted with Li-6 using ToF-SIMS.
Keywords:
Chemistry and Materials (General)
Type:
JSC-CN-30370
,
Lunar and Planetary Science Conference; Mar 17, 2014 - Mar 21, 2014; The Woodlands, TX; United States
Format:
application/pdf
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