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    Acceptable testing of VLSI components which contain error correctors (1980)
    In:  Other Sources
    Details
    Publication Date: 2011-08-17
    Description: If a VLSI chip is partitioned into functional units (FU's) and redundant FU's are added, error correcting codes may be employed to increase the yield and/or reliability of the chip. Acceptable testing is defined to be testing the chip with the error corrector functioning, thus obtaining the maximum increase in yield afforded by the error correction. The acceptable testing theorem shows that the use of coding and error correction in conjunction with acceptable testing can significantly increase the yield of VLSI chips without seriously compromising their reliability.
    Keywords: COMPUTER OPERATIONS AND HARDWARE
    Type: IEEE Transactions on Computers; C-29; Feb. 198
    Format: text
    Location Call Number Expected Availability
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    NASA TECHNICAL REPORTS
  • 2
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    Digital multiplexing of analog data in a microprocessor controlled data acquisition system (1980)
    In:  Other Sources
    Details
    Publication Date: 2011-08-17
    Description: The purpose of the paper is to explore the ramifications of doing the multiplexing function in the digital domain and of using the microprocessor to replace the hardwired control logic which resides in the typical analog to digital converter. Two types of conversion (one working in parallel inputs, and one in sequential order) strategies are discussed where the microprocessor is in full control of the conversion. One advantage of using a digital multiplexor is that, contrary to an analog multiplexor, it does not degrade the fidelity of the conversion process.
    Keywords: COMPUTER OPERATIONS AND HARDWARE
    Type: IEEE Transactions on Computers; C-29; Feb. 198
    Format: text
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    NASA TECHNICAL REPORTS
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