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  • Analytical Chemistry and Spectroscopy  (4)
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  • 1
    Electronic Resource
    Electronic Resource
    Calculation of x-ray fluorescence intensities from bulk and multilayer samples (1990)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 19 (1990), S. 145-154 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Equations are derived for the calculation of x-ray fluorescence intensities from bulk and multilayer samples. Both intra- and interlayer secondary fluorescence intensities are expressed analytically, in terms of the exponential-integral function. It is shown that calculations are performed much faster with this method than with a previous method using numerical integration. As an illustration, some examples of intensity calculations are given for a thin layer on a substrate.
    Additional Material: 8 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300190312
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Glancing-incidence x-ray analysis of thin-layered materials: A reviewPresented at the Durham Conference, Durham, UK, 1993. (1995)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 24 (1995), S. 91-102 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Glancing-incidence x-rays provide a wealth of possibilities for the analysis of thin layers and multilayers. This paper discusses reflectometry under both specular and non-specular conditions, and also the combination with angle-dependent x-ray fluorescence. From these measurements information can be obtained on layer thickness, interface quality and compositional depth profile. First the historical development of glancing-incidence x-ray analysis is sketched. Then the physical principles of the interaction of glancing-incidence x-rays with samples which may contain rough interfaces are discussed. The equipment, which allows for both x-ray fluorescence and reflectivity measurements, is also described. The possibilities are illustrated with a number of examples from the literature.
    Additional Material: 15 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300240304
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  • 3
    Electronic Resource
    Electronic Resource
    Angular dependence of X-ray fluorescence intensities (1989)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 18 (1989), S. 119-129 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The x-ray fluorescence intensity of a sample contains the product of two angular-dependent factors: the first describes the angular dependence of the absorption of both incident and emitted radiation and the second is a geometrical factor accounting for the angular variation of irradiated and detected surface area. Theory for the angular dependence of x-ray intensities is presented. Good agreement is found with experimental data, measured with a novel focusing spectrometer using a small silicon detector. Measurement of the angular dependence of intensities is especially promising for the analysis of multi-layer samples.
    Additional Material: 16 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300180309
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  • 4
    Electronic Resource
    Electronic Resource
    How accurate is the fundamental parameter approach? XRF analysis of bulk and multilayer samples (1993)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 22 (1993), S. 33-38 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The accuracy of Fundamental Parameter-based XRF quantification is investigated for both bulk and multilayer analysis. It is found that for bulk materials the relative accuracy is of the order of 1% and for multilayers a few percent. The method can be set up in such a way that it contains an inherent validity check. Further possibilities of the Fundamental Parameter method are discussed.
    Additional Material: 1 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300220109
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