ISSN:
0049-8246
Schlagwort(e):
Chemistry
;
Analytical Chemistry and Spectroscopy
Quelle:
Wiley InterScience Backfile Collection 1832-2000
Thema:
Physik
Notizen:
To identify the source of a ream defect in float glass, the chemical composition of the ream has to be accurately determined, which can only be achieved by the electron probe microanalysis (EPMA) technique. Two ream samples were analyzed with EPMA. Because of the high mobility of the Na ion, caution had to be exercised to use a very low electron beam density during data acquisition. The results show that the reams in both cases are SiO2 rich, but one has more Na whereas the other has less Na than the base glass, pointing to possible different causes to the ream problems. In view of the fact that the compositional difference between a ream and the base glass is very small, several approaches were used to confirm the analytical results: the statistical t-test, the digital elemental mapping and the compositional profiling. The differential etching analysis technique was also used to supplement the information on the chemistry and structure of a ream.
Zusätzliches Material:
6 Ill.
Materialart:
Digitale Medien
URL:
http://dx.doi.org/10.1002/xrs.1300210607
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