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  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Accreditation and quality assurance 2 (1997), S. 199-202 
    ISSN: 1432-0517
    Keywords: Key words Quality assurance ; EURACHEM ; Analytical testing laboratory ; Quality criteria ; Accreditation
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Notes: Abstract  The necessity for analytical quality assurance is primarily a feature of the analytical process itself. With the full establishment of the EU domestic market, it is also becoming a legal necessity for an increasing number of analytical laboratories. The requirements which laboratories will need to fulfil are stipulated in DIN EN 45 001. Accredited testing laboratories must in fact provide evidence that they work solely in accordance with this standard. National and EU commissions, which are legislative authorities, tend therefore to specify analytical methods, e.g. in the form of regulations or appendices thereto, intended to ensure that results from different laboratories will be comparable and hence will stand up in a court of law. The analytical quality assurance system (AQS), introduced by the Baden-Württemberg Ministry for the Environment in 1984, obliges laboratories to regularly participate in collaborative studies and thereby demonstrate their ability to provide suitably accurate analyses. This alone, however, does not sufficiently demonstrate the competence of a laboratory. Only personal appraisal of the laboratory by an auditor, together with the successful analysis of a sample provided by the same and performed under his observation, can provide proof of the competence of the laboratory. From an analytical point of view, the competence of a laboratory must be regarded as the decisive factor. Competence can only be attained through analytical quality assurance, which thus must be demanded of all laboratories.
    Type of Medium: Electronic Resource
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  • 2
    Publication Date: 2018-06-11
    Description: Now that the Galileo spacecraft s tour of the Jupiter system is over, we seek to integrate all available datasets in the hopes of understanding Io as completely as possible. We have compiled information about the morphologies and locations of paterae (volcano-tectonic depressions), mountains, and hotspots on Io in a single database. It is our hope that an analysis of the spatial and temporal relationships between these features will provide more indications of the nature of the crust of Io and the mechanisms leading to these features formation. Since Io s tidal heat escapes through its crust, more knowledge about the crust will lead to an understanding of internal processes, such as magma generation and delivery to the surface, and magnitude and orientation of internal stresses.
    Keywords: Geophysics
    Type: Lunar and Planetary Science XXXV: Io, with a Dash of Titan; LPI-Contrib-1197
    Format: text
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  • 3
    Publication Date: 2019-08-26
    Description: Two factors drive us to map the Athabasca Valles area in unusual detail: (1) the extremely well-preserved and exposed surface morphologies and (2) the extensive high resolution imaging. In particular, the near-complete CTX coverage of Athabasca Valles proper and the extensive coverage of its surroundings have been invaluable. The mapping has been done exclusively in ArcGIS, using individual CTX, THEMIS VIS, and MOC frames overlying the THEMIS IR daytime basemap. MOLA shot points and gridded DTMs are also included. It was found that CTX images processed through ISIS are almost always within 300 m of the MOLA derived locations, and usually within tens of meters, with no adjustments to camera pointing. THEMIS VIS images appear to be systematically shifted to the southwest of their correct positions and MOC images are often kilometers off. The good SNR and minimal artifacts make the CTX images vastly more useful than the THEMIS VIS or MOC images. The bulk of the mapping was done at 1:50,000 scale on CTX images. In more complex areas, mapping at 1:24,000 proved necessary. The CTX images were usually simultaneously viewed on a second monitor using the ISIS3 qview program to display the full dynamic range of the CTX data. Where CTX data was not available, mapping was often done at 1:100,000 and most contacts are mapped as approximate.
    Keywords: Geophysics
    Type: Abstracts of the Annual Meeting of Planetary Geologic Mappers, Flagstaff, AZ, 2008; NASA/CP-2008-215469
    Format: application/pdf
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  • 4
    Publication Date: 2019-08-28
    Description: We are preparing a new global geo-logic map of Jupiter s volcanic moon, Io. Here we report the type of data that are now available from our global mapping efforts, and how these data can be used to investigate questions regarding the volcano-tectonic evolution of Io. We are using the new map to investigate several specific questions about the geologic evolution of Io that previously could not be well addressed, including (for example) a comparison of the areas vs. the heights of Ionian mountains to assess their stability and evolution (Fig. 1). The area-height relationships of Io s visible mountains show the low abundance and low relief of volcanic mountains (tholi) relative to tectonic mountains, consistent with formation from low-viscosity lavas less likely to build steep edifices. Mottled mountains are generally less high than lineated mountains, consistent with a degradational formation.
    Keywords: Geophysics
    Type: Abstracts of the Annual Meeting of Planetary Geologic Mappers, San Antonio, TX, 2009; 47-48; NASA/CP-2010-216680
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  • 5
    Publication Date: 2019-08-28
    Description: We are approaching the end of the third year of mapping the Athabasca Valles region of Mars. The linework has been adjusted in response to new CTX images and we are on schedule to submit the 4 MTM quads (05202, 05207, 10202, 10207) and ac-companying paper by the end of this fiscal year.
    Keywords: Geophysics
    Type: Abstracts of the Annual Meeting of Planetary Geologic Mappers, San Antonio, TX, 2009; 29-30; NASA/CP-2010-216680
    Format: application/pdf
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