ISSN:
1573-4889
Keywords:
ALUMINA SCALE
;
CHROMIA SCALE
;
RXF
;
X-RAY FLUORESCENCE
;
IN SITU OXIDATION
Source:
Springer Online Journal Archives 1860-2000
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
Abstract Refracted X-ray fluorescence (RXF) is arelatively new technique developed for studyingproperties of thin films. In this paper, formalism foranalysis of RXF measurements is derived from a newperspective. The technique is applied to the study ofthermally grown oxide scales; model predictions aretested. The evolution of chromia scales onFe-25Cr-20Ni-0.3Y alloys and some aspects of aluminascales grown on β-NiAl are investigated. Some of thedata were taken in situ, during the oxidation process.Deposited films of Fe-25Cr-20Ni-0.3Y alloys of varyingthickness and the oxidation of those films were also studied. The technique is generally applicableto thin-film studies. It provides scale-composition anddepth-profile information, scale thicknesses and growthrates, and information about transient-phase evolution.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1023/A:1018898018004
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