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  • 71.55  (1)
  • Bonded silicas  (1)
  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Applied physics 57 (1993), S. 427-430 
    ISSN: 1432-0630
    Keywords: 71.55 ; 72.20.Jv ; 72.40 ; 72.80.Ey
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract Time-resolved photoconductivity measurements have been used to characterize electron traps in wide-gap n-HgO0.3Cd0.7Te for the first time. The characterization was made possible by combining the time-resolved photoconductive data with the analytical method conventionally used in DLTS spectroscopy. Two electron traps were found in the band gap with 61 meV and 79 meV below the conduction band edge, their concentrations are 1.1×1013 cm−3 and 5.8×1011 cm−3, respectively. Compared with DLTS spectroscopy, this characterization method markedly simplifies sample preparation and experimental procedure.
    Type of Medium: Electronic Resource
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  • 2
    ISSN: 1612-1112
    Keywords: Reversed-phase column liquid chromatography ; Bonded silicas ; Relative retention ; Selectivity
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Notes: Summary Retention factors for alkylbenzenes, polyaromatic hydrocarbons, steroids, amino acids, peptides, nucleotides, nucleosides were measured with phenylsilica, benzylsilica, phenethylsilica and octylsilica stationary phases using hydro-organic eluents containing methanol, acetonitrile or tetrahydrofuran. The retention behavior of the three arylsilicas was similar but distinctly different from that of octylsilica. The difference is attributed to the chemical properties of the organic ligates, i.e., of the alkyl- and aryl functions. The slight variations of retention behavior observed with arylsilicas on the other hand are believed to arise from differences in the pertiment phase ratios. The method used for interpretation of data is based on the analysis of the pertinent retention moduli, relative column retentivities and relative phase ratios. In addition, relationships between eluite structure and retention were examined. The results give insight into various phenomena underlying the retention process in reversed-phase chromatography.
    Type of Medium: Electronic Resource
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