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  • Aerosol epsilon; Aerosol epsilon, standard deviation; Aerosol optical thickness at 865 nm; Aerosol optical thickness at 865 nm, standard deviation; Chlorophyll a; Chlorophyll a, standard deviation; DATE/TIME; DEPTH, water; derived from MERIS remote sensing data; LATITUDE; LONGITUDE; MERIS_1; Number of pixels; Reflectance at 413 nm; Reflectance at 413 nm, standard deviation; Reflectance at 443 nm; Reflectance at 443 nm, standard deviation; Reflectance at 490 nm; Reflectance at 490 nm, standard deviation; Reflectance at 510 nm; Reflectance at 510 nm, standard deviation; Reflectance at 560 nm; Reflectance at 560 nm, standard deviation; Reflectance at 620 nm; Reflectance at 620 nm, standard deviation; Reflectance at 665 nm; Reflectance at 665 nm, standard deviation; Reflectance at 681 nm; Reflectance at 681 nm, standard deviation; Reflectance at 708 nm; Reflectance at 708 nm, standard deviation; Reflectance at 753 nm; Reflectance at 753 nm, standard deviation; Reflectance at 778 nm; Reflectance at 778 nm, standard deviation; Reflectance at 865 nm; Reflectance at 865 nm, standard deviation; Sample code/label; SAT; Satellite remote sensing; Suspended matter, total; Suspended matter, total, standard deviation; Yellow substance absorption; Yellow substance absorption, standard deviation  (2)
  • PACS: 42.25.Fx; 78.40.-q  (2)
  • 61.55  (1)
  • 78.40  (1)
Collection
Keywords
Publisher
  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Applied physics 68 (1999), S. 87-92 
    ISSN: 1432-0649
    Keywords: PACS: 42.25.Fx; 78.40.-q
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Springer
    Applied physics 68 (1999), S. 225-232 
    ISSN: 1432-0649
    Keywords: PACS: 42.25.Fx; 78.40.-q
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Springer
    The European physical journal 12 (1989), S. 521-525 
    ISSN: 1434-6079
    Keywords: 41.70 ; 78.40 ; 82.70
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract Small particles, produced in usual experiments, commonly form many-particle systems. Interactions of various kinds among the particles influence the properties of such systems. We consider here the optical properties of noble metal particle systems with separated nearly spherical particles and with aggregates formed by induced coagulation of the single particles. In order to describe their optical extinction we apply electrodynamic interaction models on particles and aggregates. We perform a quantitative analysis of the extinction spectrum of one selected sample with the electrodynamic interaction model.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Springer
    The European physical journal 26 (1993), S. 242-245 
    ISSN: 1434-6079
    Keywords: 41.70 ; 61.55 ; 73.40 ; 82.70
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract Extinction spectra of Agx-Au(1−x)-alloy particles embedded in glass are compared to spectra of gold coated silver clusters and silver coated gold clusters. It is shown, that the optical extinction of alloy particles is described by the Mie theory applying the homogeneous dielectric function $$\hat \varepsilon $$ (ω,R, x) measured by Paquet. The absorption of core-shell clusters was calculated deriving an extension of the Mie theory to spheres with arbitrary numbers of shells of arbitrary materials. Comparison to measured spectra points to s-electron motion in the clusters with only slight scattering at the interior interface. The appearance of two distinct Mie peaks however proves the existence of the sharp Ag-Au interface. The extended Mie formalism was also applied to a multilayer system consisting of sodium and a dielectric substance as an example for a spherical hetero structure.
    Type of Medium: Electronic Resource
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  • 5
    Publication Date: 2024-01-19
    Keywords: Aerosol epsilon; Aerosol epsilon, standard deviation; Aerosol optical thickness at 865 nm; Aerosol optical thickness at 865 nm, standard deviation; Chlorophyll a; Chlorophyll a, standard deviation; DATE/TIME; DEPTH, water; derived from MERIS remote sensing data; LATITUDE; LONGITUDE; MERIS_1; Number of pixels; Reflectance at 413 nm; Reflectance at 413 nm, standard deviation; Reflectance at 443 nm; Reflectance at 443 nm, standard deviation; Reflectance at 490 nm; Reflectance at 490 nm, standard deviation; Reflectance at 510 nm; Reflectance at 510 nm, standard deviation; Reflectance at 560 nm; Reflectance at 560 nm, standard deviation; Reflectance at 620 nm; Reflectance at 620 nm, standard deviation; Reflectance at 665 nm; Reflectance at 665 nm, standard deviation; Reflectance at 681 nm; Reflectance at 681 nm, standard deviation; Reflectance at 708 nm; Reflectance at 708 nm, standard deviation; Reflectance at 753 nm; Reflectance at 753 nm, standard deviation; Reflectance at 778 nm; Reflectance at 778 nm, standard deviation; Reflectance at 865 nm; Reflectance at 865 nm, standard deviation; Sample code/label; SAT; Satellite remote sensing; Suspended matter, total; Suspended matter, total, standard deviation; Yellow substance absorption; Yellow substance absorption, standard deviation
    Type: Dataset
    Format: text/tab-separated-values, 39485 data points
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  • 6
    Publication Date: 2024-01-19
    Keywords: Aerosol epsilon; Aerosol epsilon, standard deviation; Aerosol optical thickness at 865 nm; Aerosol optical thickness at 865 nm, standard deviation; Chlorophyll a; Chlorophyll a, standard deviation; DATE/TIME; DEPTH, water; derived from MERIS remote sensing data; LATITUDE; LONGITUDE; MERIS_1; Number of pixels; Reflectance at 413 nm; Reflectance at 413 nm, standard deviation; Reflectance at 443 nm; Reflectance at 443 nm, standard deviation; Reflectance at 490 nm; Reflectance at 490 nm, standard deviation; Reflectance at 510 nm; Reflectance at 510 nm, standard deviation; Reflectance at 560 nm; Reflectance at 560 nm, standard deviation; Reflectance at 620 nm; Reflectance at 620 nm, standard deviation; Reflectance at 665 nm; Reflectance at 665 nm, standard deviation; Reflectance at 681 nm; Reflectance at 681 nm, standard deviation; Reflectance at 708 nm; Reflectance at 708 nm, standard deviation; Reflectance at 753 nm; Reflectance at 753 nm, standard deviation; Reflectance at 778 nm; Reflectance at 778 nm, standard deviation; Reflectance at 865 nm; Reflectance at 865 nm, standard deviation; Sample code/label; SAT; Satellite remote sensing; Suspended matter, total; Suspended matter, total, standard deviation; Yellow substance absorption; Yellow substance absorption, standard deviation
    Type: Dataset
    Format: text/tab-separated-values, 49272 data points
    Location Call Number Expected Availability
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