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  • 1
    Electronic Resource
    Electronic Resource
    Dopant-induced excimer laser ablation of poly(tetrafluoroethylene) (1992)
    Springer
    Applied physics 55 (1992), S. 488-493 
    Details
    ISSN: 1432-0649
    Keywords: 42.55.Gp ; 78.65 ; 81.60.Jw ; 82.50
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract Clean ablation of poly(tetrafluoroethylene) (PTFE) at etch rates in excess of 7µm/pulse has been achieved with an excimer laser using 308nm radiation and a 25 ns pulse width. This was accomplished by doping the ultraviolet-transparent PTFE polymer with polyimide. Ablation rates were investigated as a function of fluence in the range from 1 to 12J/cm2 and dopant levels up to 15% (wt/wt). Results show that at a given fluence there exists an optimum absorption coefficient ⇌max, for which maximum ablation rates are achieved. The value of ⇌max was found to decrease with increasing fluence. The relationship between ⇌max and fluence was determined from existing ablation rate models and found to compare favorably with empirical results.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00332507
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    Paper (German National Licenses)
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  • 2
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    Accelerated stress testing of amorphous silicon solar cells (1985)
    In:  Other Sources
    Details
    Publication Date: 2011-08-19
    Description: A technique for performing accelerated stress tests of large-area thin a-Si solar cells is presented. A computer-controlled short-interval test system employing low-cost ac-powered ELH illumination and a simulated a-Si reference cell (seven individually bandpass-filtered zero-biased crystalline PIN photodiodes) calibrated to the response of an a-Si control cell is described and illustrated with flow diagrams, drawings, and graphs. Preliminary results indicate that while most tests of a program developed for c-Si cells are applicable to a-Si cells, spurious degradation may appear in a-Si cells tested at temperatures above 130 C.
    Keywords: ENERGY PRODUCTION AND CONVERSION
    Format: text
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    NASA TECHNICAL REPORTS
  • 3
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    An accelerated stress testing program for determining the reliability sensitivity of silicon solar cells to encapsulation and metallization systems (1982)
    In:  Other Sources
    Details
    Publication Date: 2011-08-18
    Description: The use of accelerated testing methods in a program to determine the reliability attributes of terrestrial silicon solar cells is discussed. Different failure modes are to be expected when cells with and without encapsulation are subjected to accelerated testing and separate test schedules for each are described. Unencapsulated test cells having slight variations in metallization are used to illustrate how accelerated testing can highlight different diffusion related failure mechanisms. The usefulness of accelerated testing when applied to encapsulated cells is illustrated by results showing that moisture related degradation may be many times worse with some forms of encapsulation than with no encapsulation at all.
    Keywords: ENERGY PRODUCTION AND CONVERSION
    Format: text
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    NASA TECHNICAL REPORTS
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