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  • 34.80G  (2)
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  • 1
    Electronic Resource
    Electronic Resource
    Performance improvement of an x-ray preionized XeCl laser of very small discharge volume (1986)
    Springer
    Applied physics 41 (1986), S. 31-37 
    Details
    ISSN: 1432-0649
    Keywords: 34.80G ; 42.55 ; 52.80
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract Increasing the preionization electron density is found to be an effective method for improving the output performance of discharge-pumped excimer lasers at high gas pressures when the power-supply voltage becomes a limiting factor. In a small volume (2 cm3), x-ray preionized discharge, orders of magnitude improvement in XeCl laser power output (up to 400 kW) and pulse energy (up to 26 mJ) over previously reported results have been found possible using this method. Modifications to the low energy x-ray source and discharge system leading to these improvements are described. Various laser output characteristics are also presented and discussed.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00697524
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Attachment kinetics and life time of perionization electrons in rate-gas halogen laser mixtures (1986)
    Springer
    Applied physics 40 (1986), S. 15-23 
    Details
    ISSN: 1432-0649
    Keywords: 34.80G ; 42.55 ; 52.80
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract Experiments on homogeneous initiation of pulsed avalanche discharges in typical XeCl laser mixtures show that the x-ray preionization pulse remains effective after a time delay of the order of 20 μs even at very high gas pressures (∼15 atm). Detailed kinetics analyses indicate that dissociative attachment of HCl is relatively slow during and after the preionization period so that the long effective delay time cannot be attributed to the storage effect of Cl− ions. Instead, the observed phenomenon can be attributed to the long survival time of the free electrons due to relatively slow diffusion and electron-ion recombination. Some problems arising from quantitative interpretation of the experimental results are also noted and discussed.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00697222
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    Paper (German National Licenses)
    Fulltext
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