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  • 33.70-w  (1)
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    Electronic Resource
    Electronic Resource
    Line shape analysis for Zeeman modulation spectroscopy (1980)
    Springer
    Applied physics 22 (1980), S. 71-75 
    Details
    ISSN: 1432-0630
    Keywords: 33.70-w ; 33.55+c
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract The technique of Zeeman modulation spectroscopy has been applied to the nitric oxide fundamental in order to compare the observed line shapes and intensities with theory. A predicted change of the sign of theg J factor at high rotational states has been verified experimentally. The tunable laser source used in the experiment was a spin-flip Raman laser.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00897935
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