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  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Journal of low temperature physics 105 (1996), S. 1415-1420 
    ISSN: 1573-7357
    Keywords: 74.62Dh
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract Cu-site substituted thin films of YBa2(Cu1-zMz)3O7-δ (M=Zn,Ni) are reinvestigated. The Tc-suppression and residual resistivities ϱo are measured as a function of the concentration z. We found that for low concentrations z 〈 4% the substituents occupy preferrably the in-plane Cu sites whereas for higher concentrations the chain sites are also occupied. Although the residual resistivities of Ni and Zn differ only slightly, the Tc-suppression of Zn is 2.3 times larger than that of Ni. To reconcile the measured resistivities with predictions of a two dimensional scattering model, it is necessary to assume a scattering potential of finite range and to take scattering phase shifts] δl of higher angular momentum (l 〉 0) into account. The different Tc-suppression rates for Zn and Ni are also discussed within this picture.
    Type of Medium: Electronic Resource
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  • 2
    ISSN: 1572-9605
    Keywords: Bi-2212 thin films ; dc sputtering ; structural characterization
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Notes: Abstract We report a dc sputtering method for the fullin situ preparation of Bi2Sr2CaCu2O8+δ thin films on SrTiO3 and LaAlO3.T c values of more than 90 K can be achieved by oxidizing annealing below the melting point, followed by a reducing anneal at 500°C. The structural properties of the films are revealed by X-ray diffraction in Bragg-Brentano geometry (strongc-axis orientation with FWHM (0 0 10)=0.3) and also byΦ scans (epitaxy within the substrate plane). Rutherford backscattering and channeling confirmed the correct composition of the cations while the minimum yield,χ min, is 23%. Depth profiles by SNMS show a very homogeneous distribution of the cations with no detectable loss of bismuth near the surface. The surface morphology of the films was studied by SEM and by STM. Patterning of the films in lateral geometry can be performed by photolithographic techniques without degradation ofT c .
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Springer
    Journal of superconductivity 7 (1994), S. 197-200 
    ISSN: 1572-9605
    Keywords: Superconducting superlattices ; structural characterization ; flux motion ; critical currents
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Notes: Abstract We investigated the structural and superconducting properties ofc-axis oriented (YBa2Cu3O7) nY /(PrBa2Cu3O7) npr superlattices with thicknesses of the individual layers down to one unit cell (10≥nY≥1; 18〉nPr≥ 1). By transmission electron microscopy and X-ray diffraction we find an excellent structural quality of the samples, though the quantitative analysis shows the existence of defects. In superlattices with decoupled YBa2Cu3O7 layers of two unit cell thickness we find a highT c value of 75 K. We probed the flux line structure in the superlattices by measurements of the critical current density in magnetic fields. The experiments show that the flux-line dynamics is dominated by the movement of pancake vortices.
    Type of Medium: Electronic Resource
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  • 4
    ISSN: 1434-6079
    Keywords: 25.70.-Z ; 34.00 ; 34.80.Nz
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract Ion-beam induced attenuations of transient magnetic fields have been further studied in measurements on high-velocity24Mg- and28Si-ions as well as low-velocity48Ti-ions using energetic beams of Ti- and Br-ions. Further evidence for the stopping power dependence of the attenuations is found; more data in the threshold region of Fe-host support earlier observations. In Gd-host the attenuations are again weaker pronounced than in Fe in accordance with previous data.
    Type of Medium: Electronic Resource
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