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  • 1
    Electronic Resource
    Electronic Resource
    Tinplates and tin/chromium interfaces studied by electron spectroscopies (1988)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 12 (1988), S. 198-202 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Tinplates used for can manufacturing have been analysed by XPS in combination with noble gas ion bombardment. In order to study the influence of the tin coating on the passivation layer, tinplates with different coatings were analysed. In contrast to the chemical measurements a difference was found between a tin coating equal to 1.0 g Sn/m2 and plates with larger coatings. The difference was diminished after a period of six months. With the purpose of clarifying the role of diffusion effects separate investigations of the Sn/Cr interface were conducted. The time effects are explaned by a model where diffusion of chromium due to the presence of tin and due to oxidation of metallic chromium is considered.
    Additional Material: 8 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740120305
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  • 2
    Electronic Resource
    Electronic Resource
    On the use of the quartz crystal microbalance for surface analysis in combination with surface sensitive spectroscopies (1986)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 9 (1986), S. 119-123 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The quartz crystal microbalance (QCM) has a wide range of applications in surface physics and surface chemistry. We present result obtained by combining the high areal density sensitivety of the QCM with surface sensitive spectroscopies like Auger electron spectroscopy (AES) and ion surface scattering (ISS). One type of experiments deals with measurements of sputtering yield variations during ion profiling of metal-metal interfaces, situated at the surface of the QCM, as a function of varying surface composition. A new method for online measurements of angular distributions of sputtered particles from a solid surface, by utilizing the QCM's as collectors of the ejected particles, is the subject of the other type of experiment.
    Additional Material: 7 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740090207
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    Paper (German National Licenses)
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