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  • 1
    Electronic Resource
    Electronic Resource
    Calculation of x-ray fluorescence intensities from bulk and multilayer samples (1990)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 19 (1990), S. 145-154 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Equations are derived for the calculation of x-ray fluorescence intensities from bulk and multilayer samples. Both intra- and interlayer secondary fluorescence intensities are expressed analytically, in terms of the exponential-integral function. It is shown that calculations are performed much faster with this method than with a previous method using numerical integration. As an illustration, some examples of intensity calculations are given for a thin layer on a substrate.
    Additional Material: 8 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300190312
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Glancing-incidence x-ray analysis of thin-layered materials: A reviewPresented at the Durham Conference, Durham, UK, 1993. (1995)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 24 (1995), S. 91-102 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Glancing-incidence x-rays provide a wealth of possibilities for the analysis of thin layers and multilayers. This paper discusses reflectometry under both specular and non-specular conditions, and also the combination with angle-dependent x-ray fluorescence. From these measurements information can be obtained on layer thickness, interface quality and compositional depth profile. First the historical development of glancing-incidence x-ray analysis is sketched. Then the physical principles of the interaction of glancing-incidence x-rays with samples which may contain rough interfaces are discussed. The equipment, which allows for both x-ray fluorescence and reflectivity measurements, is also described. The possibilities are illustrated with a number of examples from the literature.
    Additional Material: 15 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300240304
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  • 3
    Electronic Resource
    Electronic Resource
    Glancing incidence X-ray analysis: Forgotten or to be discovered? (1994)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 22 (1994), S. 572-575 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Many analysis methods can be used to characterize surfaces and interfaces of thin layered materials. Glancing incidence x-ray analysis (GIXA) has the potential of being one of the most powerful and versatile analysis methods that can be used because it combines x-ray reflectivity (XRR) and x-ray fluorescence (XRF). This technique enables the non-destructive determination of layer thickness, interface roughness and elementary depth profile. Sophisticated laboratory instrumentation is described which enables materials to be characterized in detail using newly developed analysis algorithms.
    Additional Material: 6 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.7402201121
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  • 4
    Electronic Resource
    Electronic Resource
    Angular dependence of X-ray fluorescence intensities (1989)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 18 (1989), S. 119-129 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The x-ray fluorescence intensity of a sample contains the product of two angular-dependent factors: the first describes the angular dependence of the absorption of both incident and emitted radiation and the second is a geometrical factor accounting for the angular variation of irradiated and detected surface area. Theory for the angular dependence of x-ray intensities is presented. Good agreement is found with experimental data, measured with a novel focusing spectrometer using a small silicon detector. Measurement of the angular dependence of intensities is especially promising for the analysis of multi-layer samples.
    Additional Material: 16 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300180309
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  • 5
    Electronic Resource
    Electronic Resource
    How accurate is the fundamental parameter approach? XRF analysis of bulk and multilayer samples (1993)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 22 (1993), S. 33-38 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The accuracy of Fundamental Parameter-based XRF quantification is investigated for both bulk and multilayer analysis. It is found that for bulk materials the relative accuracy is of the order of 1% and for multilayers a few percent. The method can be set up in such a way that it contains an inherent validity check. Further possibilities of the Fundamental Parameter method are discussed.
    Additional Material: 1 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300220109
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