ALBERT

All Library Books, journals and Electronic Records Telegrafenberg

X
feed icon rss

Your email was sent successfully. Check your inbox.

An error occurred while sending the email. Please try again.

Proceed reservation?

Export
Filter
  • 07  (2)
  • 36.40  (1)
  • 41A05  (1)
  • Springer  (4)
Collection
Keywords
Publisher
  • Springer  (4)
Years
  • 1
    Electronic Resource
    Electronic Resource
    Algorithm 51. A reliable and numerically stable program for rational interpolation of lagrange data (1983)
    Springer
    Computing 31 (1983), S. 269-286 
    Details
    ISSN: 1436-5057
    Keywords: 65D05 ; 6504 ; 41A05 ; Rational interpolation ; reliable algorithms
    Source: Springer Online Journal Archives 1860-2000
    Topics: Computer Science
    Description / Table of Contents: Zusammenfassung Es wird ein Programm vorgelegt, das zu gegebenem ZählergradL, NennergradM (fürL≥M) und Daten (x j,f j),j=1,...,L+M eine rationale Interpolierende in Form eines (verallgemeinerten) Kettenbruchs liefert oder mitteilt, daß die Daten mit den vorgegebenen Graden nicht interpoliert werden können, sondern daß unerreichbare Punkte auftreten. Dazu wird der Algorithmus des Verfassers (beschrieben in [2]) mit der von Graves-Morris [1] angegebenen Umordnung der Daten zur numerischen Stabilisierung verwendet. Diese Umordnung kann auch unterdrückt werden. Die Wirkungsweise des Programms wird an einigen Beispielen erläutert.
    Notes: Abstract This note contains a program for rational interpolation with degree of numerator equal toL and of denominator equal toM (forL≥M). The program will either produce the rational interpolation of the data (x j,f j),j=0,...,L+M by a (generalized) continued fraction or state that the interpolation is not feasible because there are unattainable points. We use the algorithm given in [2] and incorporate the reordering of data for numerical stabilisation due to Graves-Morris [1]. The reordering may be suppressed. The performance of the program is illustrated by several examples.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF02263437
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 2
    Electronic Resource
    Electronic Resource
    In-depth concentration profiling of garnet epilayers using secondary ion mass spectrometry (1977)
    Springer
    Applied physics 12 (1977), S. 283-286 
    Details
    ISSN: 1432-0630
    Keywords: 07 ; 61.80 ; 68.50
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract Rapid and reliable SIMS profiling of insulators can be achieved by using negative primary ions and a diaphragm placed on the specimen for charge compensation. Results with garnet LPE layers demonstrate the compositional variations arising from non-steady state growth conditions.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00915203
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 3
    Electronic Resource
    Electronic Resource
    On the abundance of molecular ions in secondary ion mass spectrometry (1976)
    Springer
    Applied physics 11 (1976), S. 193-195 
    Details
    ISSN: 1432-0630
    Keywords: 07
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract Changes in molecular secondary ion intensities brought about by working in an environment of oxygen can be rationalised in simple statistical terms.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00920605
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 4
    Electronic Resource
    Electronic Resource
    Determination of C60/C70 ratios in fullerene mixtures and film characterization by scanning tunneling microscopy (1993)
    Springer
    Applied physics 56 (1993), S. 197-205 
    Details
    ISSN: 1432-0630
    Keywords: 36.40 ; 61.1.P ; 68.20
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract Fullerene powder mixtures with different C60/C70 ratios have been analyzed by a variety of techniques, and results have been compared. The fullerence mixtures have been characterized as solutions in n-hexane by high-pressure liquid chromatography (HPLC) and UV-VIS spectroscopy. Thin films of fullerenes on Au(111) have been prepared from the mixtures by sublimation. The sublimation process has been studied by simultaneous thermogravimetric and differential thermal analyses. Thin fullerene films on Au(111) have been investigated by scanning tunneling microscopy (STM). The STM images show primarily two types of ballshaped molecules arranged in a lattice with hexagonal symmetry (fcc(111) face, nearest neighbour distance: 1 nm). The two species differ in diameter. STM images of films made of mixtures of different C60/C70 ratios show that C70 molecules display a larger apparent diameter (0.8 nm) and corrugation than C60 molecules (0.7 nm). The C60/C70 ratios obtained by counting the corresponding molecular species in the STM images of the thin films are compared to the C60/C70 ratios determined by HPLC on hexane solutions of the mixtures. The observed differences might be explained by different rates of sublimation for the two species. The STM images reveal film defects (vacancies and boundaries) and dynamic processes (displacement of C70 molecules and vacancies). In films prepared to have a C60 coverage of less than one monolayer, stable structural units of the C60(111) surface consisting of three or seven C60 molecules are revealed by STM. Occasionally, substructure within individual fullerene molecules is observed.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00539474
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
Close ⊗
This website uses cookies and the analysis tool Matomo. More information can be found here...