Publikationsdatum:
2014-05-02
Beschreibung:
Article Characterizing femtosecond X-ray pulses that vary from shot to shot is important for data interpretation. Here, Behrens et al. measure time-resolved lasing effects on the electron beam and extract the temporal profile of X-ray pulses using an X-band radiofrequency transverse deflector. Nature Communications doi: 10.1038/ncomms4762 Authors: C. Behrens, F.-J. Decker, Y. Ding, V. A. Dolgashev, J. Frisch, Z. Huang, P. Krejcik, H. Loos, A. Lutman, T. J. Maxwell, J. Turner, J. Wang, M.-H. Wang, J. Welch, J. Wu
Digitale ISSN:
2041-1723
Thema:
Biologie
,
Chemie und Pharmazie
,
Allgemeine Naturwissenschaft
,
Physik
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