ISSN:
1476-4687
Source:
Nature Archives 1869 - 2009
Topics:
Biology
,
Chemistry and Pharmacology
,
Medicine
,
Natural Sciences in General
,
Physics
Notes:
[Auszug] PREVIOUS investigations have shown that transmission electron microscopy is a powerful tool for the examination of structure and imperfections in metals and semiconductors1. For transmission electron microscopy, specimen thicknesses must be of the order of a few hundred Å. In the case of ...
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1038/1991054a0
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