ISSN:
1600-5767
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Geosciences
,
Physics
Notes:
The Fourier coefficients of the line profiles of talc synthesized from sepiolite under hydrothermal conditions (temperatures: 300°C5̃25; pressure 500 atm) were calculated and interpreted using the method of Warren & Averbach [J. Appl. Phys. (1950), 21, 595; (1952), 23, 497, 1095]. The mean thickness normal to the layer plane of talc synthesized from α-sepiolite is larger than that from β-sepiolite, and the mean thickness for each type of synthesis product tends to increase with higher temperatures of synthesis. The mean square displacement, 〈Z21〉, of unit cells in a column of cells perpendicular to the reflection plane generally tends to decrease with higher temperatures of synthesis. The particle-size distribution suggests that particles tend to grow along the c* direction, since the distribution is that of nearly integer multiples of thickness.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S0021889872009495
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