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  • International Union of Crystallography (IUCr)  (3)
Collection
Publisher
Years
  • 1
    Electronic Resource
    Electronic Resource
    EDIM93: a program for electron diffraction intensity measurement from photographic data (1994)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 27 (1994), S. 430-432 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: A program, EDIM93, for electron diffraction intensity measurement has been developed. The program processes the data from digitized electron diffraction films. The profile decomposition and summation methods are introduced for measuring the blackenings of diffraction spots. They are suitable for different distributions of the spots on the film. The program is applicable to periodic structures and to (3+1)- or (3+2)-dimensional incommensurately modulated structures.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889893012968
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Direct methods for incommensurate intergrowth compounds. II. Determination of the modulation using only main reflections (1994)
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 50 (1994), S. 511-515 
    Details
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: A modified Sayre equation for incommensurate intergrowth compounds is presented. With this equation, both magnitude and phase for structure factors of satellite reflections can be estimated quantitatively through the observed intensities of main reflections, provided their phases are already known. Modulation functions can then be revealed by the Fourier synthesis calculated using the observed main reflections and the estimated satellites. The method has been tested with the known structures of two inorganic misfit layer compounds, (LaS)1.14NbS2 and (PbS)1.18TiS2. Satisfactory results were obtained.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0108767394000899
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  • 3
    Electronic Resource
    Electronic Resource
    Correction for the dynamical electron diffraction effect in crystal structure analysis (1993)
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 49 (1993), S. 877-880 
    Details
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: A method is proposed to correct for the dynamical electron diffraction effect in crystal structure analysis. A rough structure model is first obtained by conventional structure-analysis methods neglecting the dynamical diffraction effect. From the rough structure model, multislice calculations are used to estimate the crystal thickness through the observed dynamical diffraction wave amplitudes. With this estimated thickness, the observed diffraction wave amplitudes are calibrated to give a set of fictitious observed kinematic structure-factor magnitudes. Based on such a set of magnitudes, a traditional least-squares procedure is used to refine structural parameters. The reliability of the result is checked by the consistency between the observed dynamical diffraction wave amplitudes and those found from the multislice calculation. The process can be made iterative. Tests were performed with two known structures, Bi-2212 and Pb-doped Bi-2223 high-Tc superconductors, and satisfactory results were obtained.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0108767393004581
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    Paper (German National Licenses)
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