Electronic Resource
Copenhagen
:
International Union of Crystallography (IUCr)
Applied crystallography online
29 (1996), S. 159-163
ISSN:
1600-5767
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Geosciences
,
Physics
Notes:
Spatial distribution of X-ray diffusion scattering intensity conditioned by additional CuO atomic layers [stacking faults (SF)] in the AB2Cu3O7 −x (123) structure has been studied within a cinematic approach. Natural laws of difffraction-pattern changes caused by increase of SF density and by local changes of interplanar distances of atomic layers in the vicinity of SFs were obtained. The X-ray method for determination of the SF density and local changes of interplanar distances is described.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S0021889895013434
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