ISSN:
1600-5767
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Geosciences
,
Physics
Notes:
An analysis is given of the way in which thickness fluctuations in a multilayer can affect the grazing incidence X-ray reflectivity pattern. It is shown that peak shifts, broadening and height variations can result. They alter in a predictable way the parameter values derived from a fit with an ideal lattice. A principle for designed Bragg reflectors is also proposed.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S0021889896006358
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