ALBERT

All Library Books, journals and Electronic Records Telegrafenberg

X
feed icon rss

Your email was sent successfully. Check your inbox.

An error occurred while sending the email. Please try again.

Proceed reservation?

Export
Filter
  • International Union of Crystallography (IUCr)  (6)
Collection
Publisher
Years
  • 1
    Electronic Resource
    Electronic Resource
    New methods for diffraction stress measurement: a critical evaluation of new and existing methods (2000)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 33 (2000), S. 1059-1066 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: New methods of diffraction stress analysis of polycrystalline materials, consisting of cubic elastically anisotropic crystallites, are proposed and compared with existing methods. Whereas for the existing methods knowledge of the diffraction elastic constants is presupposed, three new methods are presented that require only knowledge of the (macroscopic) mechanical elastic constants. The stress values obtained with these new methods on the basis of the mechanical elastic constants are more reliable than those obtained with the methods on the basis of the diffraction elastic constants. New and existing methods are illustrated by means of measurements of X-ray diffraction from a magnetron-sputtered TiN layer.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889800004258
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 2
    Electronic Resource
    Electronic Resource
    A tool for X-ray diffraction analysis of thin layers on substrates: substrate peak removal method (2000)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 33 (2000), S. 108-111 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: A method is proposed that removes the substrate peaks from a diffraction pattern recorded from a substrate covered with a thin layer, using a separate measurement of the uncovered substrate. The obtained diffractogram without substrate peaks can then be used for the characterization of the microstructure of the thin layer. As an example, the method is shown to yield good results for a TiN layer deposited on a tool-steel substrate.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889899013461
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 3
    Electronic Resource
    Electronic Resource
    X-ray diffraction analysis of stacking and twin faults in f.c.c. metals: a revision and allowance for texture and non-uniform fault probabilities (2000)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 33 (2000), S. 296-306 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: A revision is presented of the original description by Warren [X-ray Diffraction, (1969), pp. 275–298. Massachusetts: Addison-Wesley] of the intensity distribution of powder-pattern reflections from f.c.c. metal samples containing stacking and twin faults. The assumptions (in many cases unrealistic) that fault probabilities need to be very small and equal for all fault planes and that the crystallites in the sample have to be randomly oriented have been removed. To elucidate the theory, a number of examples are given, showing how stacking and twin faults change the shape and position of diffraction peaks. It is seen that significant errors may arise from Warren's assumptions, especially in the peak maximum shift. Furthermore, it is explained how to describe powder-pattern reflections from textured specimens and specimens with non-uniform fault probabilities. Finally, it is discussed how stacking- and twin-fault probabilities (and crystallite sizes) can be determined from diffraction line-profile measurements.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889800000133
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 4
    Electronic Resource
    Electronic Resource
    Notes on the handling of position and broadening errors in deconvoluted X-ray diffraction line profiles (1980)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 13 (1980), S. 74-77 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: In deconvolution procedures of X-ray diffraction line profiles, a non-ideal standard specimen often has to be used to measure the broadening due to the instrumental aberrations and the X-ray spectrum used. This leads to a non-ideal standard line profile at an incorrect sin 0 range with an incorrect broadening. Large errors in the structural parameters to be determined may result. These errors can be minimized by choosing a proper origin for the evaluation of the Fourier series of the line profiles measured. Rules are presented for the necessary shifts of the origin of a non-ideal standard line profile compared to the origin of the line profile to be analyzed. If these shifts of origin are carried out, errors are still present from the difference in broadening between ideal and non-ideal standard specimens. Simple correction factors are presented to eliminate also these errors. The treatment is given for non-ideal standard specimens with (i) an incorrect spacing, (ii) an incorrect specimen transparency and (iii) remaining structural defects.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889880011521
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 5
    Electronic Resource
    Electronic Resource
    Use of the Voigt function in a single-line method for the analysis of X-ray diffraction line broadening (1982)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 15 (1982), S. 308-314 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: The use of the Voigt function for the analysis of the integral breadths of broadened X-ray diffraction line profiles forms the basis of a rapid and powerful single-line method of crystallite-size and strain determination which is easy to apply. To avoid graphical methods or interpolation from tables, empirical formulae of high accuracy are used and an estimation of errors is presented, including the influence of line-profile asymmetry. The method is applied to four practical cases of size-strain broadening: (i) cold-worked nickel, (ii) a nitrided steel, (iii) an electrodeposited nickel layer and (iv) a liquid-quenched AlSi alloy.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889882012035
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 6
    Electronic Resource
    Electronic Resource
    Diffraction-Line Broadening due to Strain Fields in Materials; Fundamental Aspects and Methods of Analysis (1996)
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 52 (1996), S. 730-747 
    Details
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: Broadening of (X-ray) diffraction lines is often due to the distortion fields associated with lattice defects as dislocations. A generally applicable flexible model for distributions of lattice defects and their distortion fields is presented. The model allows a straightforward calculation of diffraction-line profiles. Parameters of the model are the average distance between the defects, the extent of the distortion fields and the mean-squared strain. The order dependence of the shape and width of line profiles is studied as a function of these model parameters. The adequacy for practical application of two methods frequently used to analyse X-ray diffraction-line broadening (the Warren–Averbach analysis and the Williamson–Hall analysis) is investigated by applying them to calculating line profiles. The `size' and `strain' parameters deduced by the methods mentioned are discussed with reference to the strain-field model parameters. It is concluded that only in limiting cases can the results be related directly to the microstructure. Experimental line profiles taken from a ball-milled tungsten powder are used to show that the line profiles calculated on the basis of the strain-field model pertain to realistic situations. It is shown that, in principle, an interpretation of measured line broadening is possible directly in terms of strain-field parameters.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0108767396005727
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
Close ⊗
This website uses cookies and the analysis tool Matomo. More information can be found here...